@misc{12760,
  abstract     = {{Various degradation mechanisms can diminish the performance of electrical connectors in automobiles over time. It is crucial to gain an in-depth understanding of the failure mechanisms and their interactions, as well as to systematically analyze the failure mechanisms of connectors, assess their state of health, and predict the probability of failure in the future. This work provides a comprehensive overview of degradation mechanisms in electrical connectors, including fretting corrosion, oxidation, delamination, wear through of the protective coating, stress relaxation and plastic deformation. It focuses on mechanisms that contribute to increased contact resistance over time and proposes a unified model to explain their interactions. The study introduces a structured methodology for assessing connector health by outlining key measurement techniques and presenting an efficient approach to failure and state analysis that minimizes both testing time and sample size. This methodology is supported by analyses of connectors from long-term life tests and field-used, field-tested vehicles. Additionally, the study explores new aspects of the state analysis for accelerated testing of connectors, supported by examples from field-tested vehicles and various test methods, to predict connectors lifetime and evaluate the effectiveness of existing testing approaches.}},
  author       = {{Song, Jian and Hilmert, Dirk and Kiel, Frederik}},
  booktitle    = {{Engineering Failure Analysis}},
  issn         = {{1873-1961}},
  keywords     = {{Combined failure mechanisms, Combination of analytical methods, Procedure of analysis}},
  number       = {{5}},
  publisher    = {{Elsevier}},
  title        = {{{Mechanisms of failure and state analysis of electrical connectors in automobiles}}},
  doi          = {{10.1016/j.engfailanal.2025.109427}},
  volume       = {{173}},
  year         = {{2025}},
}

@misc{11353,
  author       = {{Hilmert, Dirk and Song, Jian}},
  booktitle    = {{Elektrische und optische Verbindungstechnik 2023 : Tagungsband der VDE/VDI GMM-Fachtagung : 9. Symposium Connectors}},
  editor       = {{Song, Jian}},
  location     = {{Lemgo}},
  pages        = {{262 -- 272}},
  publisher    = {{Labor für Feinsystemtechnik, TH OWL}},
  title        = {{{Bauraumbezogene Untersuchung der Schadensmechanismen von Steckverbindern aus Automobilen nach Langzeitbetrieb}}},
  year         = {{2023}},
}

@misc{11358,
  abstract     = {{Im Rahmen dieser Studie wird der Einfluss der Einbaulage und weiterer Parameter auf das Reibverschleiß- und Reibkorrosionsverhalten von Steckverbindern untersucht. Dazu werden Steckverbinder unterschiedlicher Typen mit verschiedenen Beschichtungsarten und Kontaktgrößen einer umfassenden Untersuchung unterzogen, indem sie Vibrations- und Reibverschleißprüfungen durchlaufen. Im Gegensatz zu früheren Studien beschränken sich die Anregungsrichtungen in diesen Prüfungen nicht nur auf die Steck- und Ziehrichtung, sondern es wird auch in den orthogonalen Richtungen dazu untersucht. Dieser Ansatz ermöglicht eine ganzheitlichere Betrachtung der Belastungen, denen die Steckverbinder ausgesetzt sind. Es werden verschiedene Messmethoden angewendet, um Gemeinsamkeiten und Unterschiede im auftretenden Verschleißverhalten zwischen den jeweiligen Prüfmethoden festzustellen. Dabei zeigt sich, dass die verschiedenen Prüfungsarten grundsätzlich unterschiedliche kritische Richtungen in Bezug auf den Verschleiß aufweisen. Auch die Kontaktgröße und die Nutzung von Einzelleiterabdichtungen haben einen großen Einfluss auf das Verschleißverhalten. }},
  author       = {{Song, Jian and Hilmert, Dirk}},
  booktitle    = {{Kontaktverhalten und Schalten : 27. VDE-Fachtagung Albert-Keil-Kontaktseminar, 27.-29. September 2023 am Karlsruher Institut für Technologie (KIT) }},
  isbn         = {{978-3-8007-6185-2}},
  location     = {{Karlsruhe }},
  pages        = {{104 -- 111}},
  publisher    = {{VDE}},
  title        = {{{Einfluss der Einbaulage und des Kabelanschlusses auf das Reibverschleiß- und Reibkorrosionsverhalten von Steckverbindern}}},
  year         = {{2023}},
}

@misc{8352,
  author       = {{Yuan, Haomiao and Hilmert, Dirk and Simonsmeier, Robin and Song, Jian}},
  booktitle    = {{ICEC 2022 - Sapporo - 31st International Conference on Electrical Contacts}},
  location     = {{Sapporo}},
  pages        = {{77 -- 82}},
  publisher    = {{ICEC}},
  title        = {{{Correlation between fretting corrosion and wear under various motion modes}}},
  year         = {{2022}},
}

@misc{9208,
  author       = {{Hilmert, Dirk and Song, Jian}},
  location     = {{Würzburg}},
  title        = {{{Einfluss von Mikrobewegungen auf Steckverbinder und deren robuste Auslegung II}}},
  year         = {{2022}},
}

@misc{9213,
  abstract     = {{The function and reliability of electrical connectors in automotive applications is crucial for vehicle safety, especially with regard to E-mobility and autonomous driving. For this reason, electrical connectors are being developed for long-term use applications. However, a small amount of function failures are still being observed in long-term use field vehicles. In this study all electrical connectors of five long-term driven vehicles from various car manufacturers are disassembled and analyzed. The same analysis procedure is followed for every vehicle and the electrical resistance of the connectors is measured to determine electrical failures. The contacts of failed connectors are further analyzed using optical microscopy, XRF spectroscopy, EDS and detailed contact resistance mapping. By comparing the connectors with electrical failures to the same types of connectors with a proper electrical resistance, failure mechanisms can be detected and analyzed. The frequency of various failure mechanisms is statistically evaluated. The results of the analysis provide valuable indications with respect to improvement of the reliability of connectors.}},
  author       = {{Hilmert, Dirk and Yuan, Haomiao and Song, Jian}},
  booktitle    = {{Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts}},
  isbn         = {{978-1-6654-5966-2}},
  issn         = {{2158-9992}},
  keywords     = {{Connectors, Resistance, Spectroscopy, Optical microscopy, Microscopy, Vehicle safety, Failure analysis}},
  location     = {{Tampa, FL, USA}},
  pages        = {{9 -- 16}},
  publisher    = {{IEEE}},
  title        = {{{The Analysis of Failure Mechanisms of Electrical Connectors in Long-term Use Field Vehicles}}},
  doi          = {{10.1109/HLM54538.2022.9969820}},
  year         = {{2022}},
}

@misc{7528,
  author       = {{Hilmert, Dirk and Krüger, Kevin and Yuan, Haomiao and Song, Jian}},
  booktitle    = {{23rd International Colloquium Tribology - industrial and automotive lubrication : conference proceedings 2022}},
  editor       = {{Topolovec-Miklozic, Ksenija}},
  pages        = {{313 – 315}},
  publisher    = {{TAE, Technische Akademie Esslingen}},
  title        = {{{Wear of electrical contacts of equal motion amplitude and equal force in different directions}}},
  volume       = {{23/1}},
  year         = {{2022}},
}

@misc{7529,
  author       = {{Krüger, Kevin and Hilmert, Dirk and Song, Jian}},
  booktitle    = {{23rd International Colloquium Tribology - industrial and automotive lubrication : conference proceedings 2022}},
  editor       = {{Topolovec-Miklozic, Ksenija and Pauschitz, Andreas  and Fatemi, Arshia }},
  isbn         = {{978-3-8169-3547-6}},
  location     = {{Ostfildern ; Online}},
  pages        = {{219 – 222}},
  publisher    = {{TAE, Technische Akademie Esslingen}},
  title        = {{{Mounting Positions of Electrical Connectors and the Wear of Coatings under Vibration Loads}}},
  volume       = {{23/1}},
  year         = {{2022}},
}

@misc{7527,
  author       = {{Hilmert, Dirk and Koch, Christian  and Song, Jian}},
  location     = {{online}},
  publisher    = {{Forschungsvereinigung Antriebstechnik}},
  title        = {{{Einfluss von Mikrobewegungen auf Steckverbinder und deren robuste Auslegung}}},
  year         = {{2021}},
}

@inproceedings{6289,
  author       = {{Hilmert, Dirk and Yuan, Haomiao and Song, Jian}},
  booktitle    = {{Tagungsband der VDE/VDI-GMM-Fachtagung „Symposium Connectors“}},
  location     = {{Lemgo}},
  pages        = {{117 -- 126}},
  title        = {{{Untersuchung der Korrelation zwischen Verschleißenergie und Verschleißvolumen an Kupferkontakten mit Silberbeschichtung}}},
  year         = {{2021}},
}

@inproceedings{6342,
  author       = {{Hilmert, Dirk and Krüger, Kevin and Song, Jian}},
  booktitle    = {{Tagungsband der 62. Tribologie-Fachtagung 2021}},
  location     = {{Göttingen}},
  title        = {{{Vergleichende Untersuchung der Verschleißbilder von Steckverbindern aus Reibverschleiß- und Vibrationsprüfungen mit unterschiedlichen Prüfrichtungen}}},
  year         = {{2021}},
}

@inproceedings{6324,
  author       = {{Yuan, Haomiao and Hilmert, Dirk and Shukla, Abhay Rammurti and Song, Jian}},
  booktitle    = {{Proceedings of the 66th IEEE Holm Conference on Electrical Contacts}},
  title        = {{{Effect of Direction of Motion on Fretting Corrosion Behaviour}}},
  year         = {{2020}},
}

@inproceedings{6326,
  author       = {{Song, Jian and Yuan, Haomiao and Shukla, Abhay Rammurti and Koch, Christian and Hilmert, Dirk}},
  booktitle    = {{Proceedings of the 65th IEEE Holm Conference on Electrical Contacts}},
  location     = {{Milwaukee}},
  title        = {{{Correlation of connector contact failures in accelerated testing and in long-term use field vehicles}}},
  year         = {{2019}},
}