---
_id: '2070'
abstract:
- lang: eng
  text: 'A Two-Layer Conflict Solving data fusion approach is proposed in this work,
    with an aim to provide another approach to data fusion community. Since the evidence
    of Dempster-Shafer Theory, algorithms for combining pieces of evidence have drawn
    a considerable attention from data fusion researchers, along with many alternatives
    invented. However, none of these approaches receive an agreement for being able
    to perform very successfully in all scenarios and hence this topic is still in
    hot discussion. Therefore, the suggested approach in this work will contribute
    as a novel method and present its own merits. '
author:
- first_name: Rui
  full_name: Li, Rui
  id: '2000'
  last_name: Li
- first_name: Volker
  full_name: Lohweg, Volker
  id: '1804'
  last_name: Lohweg
  orcid: 0000-0002-3325-7887
citation:
  ama: 'Li R, Lohweg V. A Novel Data Fusion Approach using Two-Layer Conflict Solving.
    In: ; 2008.'
  apa: Li, R., & Lohweg, V. (2008). A Novel Data Fusion Approach using Two-Layer
    Conflict Solving.
  bjps: <b>Li R and Lohweg V</b> (2008) A Novel Data Fusion Approach Using Two-Layer
    Conflict Solving.
  chicago: Li, Rui, and Volker Lohweg. “A Novel Data Fusion Approach Using Two-Layer
    Conflict Solving,” 2008.
  chicago-de: 'Li, Rui und Volker Lohweg. 2008. A Novel Data Fusion Approach using
    Two-Layer Conflict Solving. In: .'
  din1505-2-1: '<span style="font-variant:small-caps;">Li, Rui</span> ; <span style="font-variant:small-caps;">Lohweg,
    Volker</span>: A Novel Data Fusion Approach using Two-Layer Conflict Solving.
    In: , 2008'
  havard: 'R. Li, V. Lohweg, A Novel Data Fusion Approach using Two-Layer Conflict
    Solving, in: 2008.'
  ieee: R. Li and V. Lohweg, “A Novel Data Fusion Approach using Two-Layer Conflict
    Solving,” 2008.
  mla: Li, Rui, and Volker Lohweg. <i>A Novel Data Fusion Approach Using Two-Layer
    Conflict Solving</i>. 2008.
  short: 'R. Li, V. Lohweg, in: 2008.'
  ufg: '<b>Li, Rui/Lohweg, Volker (2008)</b>: A Novel Data Fusion Approach using Two-Layer
    Conflict Solving, in: .'
  van: Li R, Lohweg V. A Novel Data Fusion Approach using Two-Layer Conflict Solving.
    In 2008.
date_created: 2019-11-29T14:05:44Z
date_updated: 2023-03-15T13:49:38Z
department:
- _id: DEP5023
keyword:
- fusion community
- data fusion researcher
- dempster-shafer theory
- many alternative
- novel method
- considerable attention
- hot discussion
- suggested approach
language:
- iso: eng
main_file_link:
- open_access: '1'
  url: https://www.eurasip.org/Proceedings/Ext/CIP2008/papers/1569094849.pdf
oa: '1'
publication_status: published
status: public
title: A Novel Data Fusion Approach using Two-Layer Conflict Solving
type: conference
user_id: '45673'
year: 2008
...
---
_id: '2071'
abstract:
- lang: eng
  text: In this paper, a fuzzy pattern classification tuning approach is proposed,
    which is based on fusion concept. In this method, tuning parameters are learned
    in a training procedure, enabling system to be capable of managing individual
    classification task. Fuzzy c-means, as a specific instance of Tuning Reference,
    is employed as a tool to offer membership function which is used for making decisions
    and its membership function fuses (tunes) another membership function captured
    from fuzzy pattern classification and then final decisions are made upon fused
    one. Experiments are taken on five benchmark datasets, one of them shows an equal
    performance and the other four present better results than each single classifier.
author:
- first_name: Rui
  full_name: Li, Rui
  id: '2000'
  last_name: Li
- first_name: Volker
  full_name: Lohweg, Volker
  id: '1804'
  last_name: Lohweg
  orcid: 0000-0002-3325-7887
citation:
  ama: 'Li R, Lohweg V. Fuzzy Pattern Classification Tuning by Parameter Learning
    based on Fusion Concept. In: In: The 11th Conference on Information Fusion, June
    30 - July 3, Cologne, Germany; 2008.'
  apa: 'Li, R., &#38; Lohweg, V. (2008). Fuzzy Pattern Classification Tuning by Parameter
    Learning based on Fusion Concept. In: The 11th Conference on Information Fusion,
    June 30 - July 3, Cologne, Germany.'
  bjps: '<b>Li R and Lohweg V</b> (2008) Fuzzy Pattern Classification Tuning by Parameter
    Learning Based on Fusion Concept. In: The 11th Conference on Information Fusion,
    June 30 - July 3, Cologne, Germany.'
  chicago: 'Li, Rui, and Volker Lohweg. “Fuzzy Pattern Classification Tuning by Parameter
    Learning Based on Fusion Concept.” In: The 11th Conference on Information Fusion,
    June 30 - July 3, Cologne, Germany, 2008.'
  chicago-de: 'Li, Rui und Volker Lohweg. 2008. Fuzzy Pattern Classification Tuning
    by Parameter Learning based on Fusion Concept. In: . In: The 11th Conference on
    Information Fusion, June 30 - July 3, Cologne, Germany.'
  din1505-2-1: '<span style="font-variant:small-caps;">Li, Rui</span> ; <span style="font-variant:small-caps;">Lohweg,
    Volker</span>: Fuzzy Pattern Classification Tuning by Parameter Learning based
    on Fusion Concept. In:  : In: The 11th Conference on Information Fusion, June
    30 - July 3, Cologne, Germany, 2008'
  havard: 'R. Li, V. Lohweg, Fuzzy Pattern Classification Tuning by Parameter Learning
    based on Fusion Concept, in: In: The 11th Conference on Information Fusion, June
    30 - July 3, Cologne, Germany, 2008.'
  ieee: R. Li and V. Lohweg, “Fuzzy Pattern Classification Tuning by Parameter Learning
    based on Fusion Concept,” 2008.
  mla: 'Li, Rui, and Volker Lohweg. <i>Fuzzy Pattern Classification Tuning by Parameter
    Learning Based on Fusion Concept</i>. In: The 11th Conference on Information Fusion,
    June 30 - July 3, Cologne, Germany, 2008.'
  short: 'R. Li, V. Lohweg, in: In: The 11th Conference on Information Fusion, June
    30 - July 3, Cologne, Germany, 2008.'
  ufg: '<b>Li, Rui/Lohweg, Volker (2008)</b>: Fuzzy Pattern Classification Tuning
    by Parameter Learning based on Fusion Concept, in: .'
  van: 'Li R, Lohweg V. Fuzzy Pattern Classification Tuning by Parameter Learning
    based on Fusion Concept. In In: The 11th Conference on Information Fusion, June
    30 - July 3, Cologne, Germany; 2008.'
date_created: 2019-11-29T14:09:33Z
date_updated: 2023-03-15T13:49:38Z
department:
- _id: DEP5023
keyword:
- tuning parameter
- information fusion
- fuzzy cmeans
- membership function
- fuzzy pattern classification
language:
- iso: eng
main_file_link:
- url: https://ieeexplore.ieee.org/document/4632223/keywords#full-text-header
publication_identifier:
  isbn:
  - 978-3-8007-3092-6
publication_status: published
publisher: 'In: The 11th Conference on Information Fusion, June 30 - July 3, Cologne,
  Germany'
status: public
title: Fuzzy Pattern Classification Tuning by Parameter Learning based on Fusion Concept
type: conference
user_id: '45673'
year: 2008
...
---
_id: '2072'
author:
- first_name: Volker
  full_name: Lohweg, Volker
  id: '1804'
  last_name: Lohweg
  orcid: 0000-0002-3325-7887
- first_name: Frank
  full_name: Possel-Dölken, Frank
  last_name: Possel-Dölken
citation:
  ama: 'Lohweg V, Possel-Dölken F. Oberflächenanalyse mit intelligenten Netzwerk-Kameras
    - Virtuelle Produktentwicklung mit Simulation/Verkürzung Time-to-Market durch
    Einsatz von Simulationstechniken. In: Innovationsdialog NRW, dSPACE GmbH, Technologiepark,
    Paderborn; 2008.'
  apa: Lohweg, V., &#38; Possel-Dölken, F. (2008). Oberflächenanalyse mit intelligenten
    Netzwerk-Kameras - Virtuelle Produktentwicklung mit Simulation/Verkürzung Time-to-Market
    durch Einsatz von Simulationstechniken. Innovationsdialog NRW, dSPACE GmbH, Technologiepark,
    Paderborn.
  bjps: <b>Lohweg V and Possel-Dölken F</b> (2008) Oberflächenanalyse Mit Intelligenten
    Netzwerk-Kameras - Virtuelle Produktentwicklung Mit Simulation/Verkürzung Time-to-Market
    Durch Einsatz von Simulationstechniken. Innovationsdialog NRW, dSPACE GmbH, Technologiepark,
    Paderborn.
  chicago: Lohweg, Volker, and Frank Possel-Dölken. “Oberflächenanalyse Mit Intelligenten
    Netzwerk-Kameras - Virtuelle Produktentwicklung Mit Simulation/Verkürzung Time-to-Market
    Durch Einsatz von Simulationstechniken.” Innovationsdialog NRW, dSPACE GmbH, Technologiepark,
    Paderborn, 2008.
  chicago-de: 'Lohweg, Volker und Frank Possel-Dölken. 2008. Oberflächenanalyse mit
    intelligenten Netzwerk-Kameras - Virtuelle Produktentwicklung mit Simulation/Verkürzung
    Time-to-Market durch Einsatz von Simulationstechniken. In: . Innovationsdialog
    NRW, dSPACE GmbH, Technologiepark, Paderborn.'
  din1505-2-1: '<span style="font-variant:small-caps;">Lohweg, Volker</span> ; <span
    style="font-variant:small-caps;">Possel-Dölken, Frank</span>: Oberflächenanalyse
    mit intelligenten Netzwerk-Kameras - Virtuelle Produktentwicklung mit Simulation/Verkürzung
    Time-to-Market durch Einsatz von Simulationstechniken. In:  : Innovationsdialog
    NRW, dSPACE GmbH, Technologiepark, Paderborn, 2008'
  havard: 'V. Lohweg, F. Possel-Dölken, Oberflächenanalyse mit intelligenten Netzwerk-Kameras
    - Virtuelle Produktentwicklung mit Simulation/Verkürzung Time-to-Market durch
    Einsatz von Simulationstechniken, in: Innovationsdialog NRW, dSPACE GmbH, Technologiepark,
    Paderborn, 2008.'
  ieee: V. Lohweg and F. Possel-Dölken, “Oberflächenanalyse mit intelligenten Netzwerk-Kameras
    - Virtuelle Produktentwicklung mit Simulation/Verkürzung Time-to-Market durch
    Einsatz von Simulationstechniken,” 2008.
  mla: Lohweg, Volker, and Frank Possel-Dölken. <i>Oberflächenanalyse Mit Intelligenten
    Netzwerk-Kameras - Virtuelle Produktentwicklung Mit Simulation/Verkürzung Time-to-Market
    Durch Einsatz von Simulationstechniken</i>. Innovationsdialog NRW, dSPACE GmbH,
    Technologiepark, Paderborn, 2008.
  short: 'V. Lohweg, F. Possel-Dölken, in: Innovationsdialog NRW, dSPACE GmbH, Technologiepark,
    Paderborn, 2008.'
  ufg: '<b>Lohweg, Volker/Possel-Dölken, Frank (2008)</b>: Oberflächenanalyse mit
    intelligenten Netzwerk-Kameras - Virtuelle Produktentwicklung mit Simulation/Verkürzung
    Time-to-Market durch Einsatz von Simulationstechniken, in: .'
  van: Lohweg V, Possel-Dölken F. Oberflächenanalyse mit intelligenten Netzwerk-Kameras
    - Virtuelle Produktentwicklung mit Simulation/Verkürzung Time-to-Market durch
    Einsatz von Simulationstechniken. In Innovationsdialog NRW, dSPACE GmbH, Technologiepark,
    Paderborn; 2008.
date_created: 2019-11-29T14:13:23Z
date_updated: 2023-03-15T13:49:38Z
department:
- _id: DEP5023
language:
- iso: eng
publication_status: published
publisher: Innovationsdialog NRW, dSPACE GmbH, Technologiepark, Paderborn
status: public
title: Oberflächenanalyse mit intelligenten Netzwerk-Kameras - Virtuelle Produktentwicklung
  mit Simulation/Verkürzung Time-to-Market durch Einsatz von Simulationstechniken
type: conference
user_id: '45673'
year: 2008
...
---
_id: '2073'
abstract:
- lang: eng
  text: Synthetic surfaces, in particular polymer structures, which are used for electronic
    components, have to be inspected in industrial processes. Polymers show some specific
    surface characteristics. This a-priori knowledge is useable for the feature extraction
    of a surface texture and a following classification. The feature extraction is
    performed by using statistical information, calculated from sum and difference
    histograms, while the classification is executed by a fuzzy pattern classifier.
    A defect area can be recognized just on the basis of the tested image and without
    the need of any further reference learning data. The classification of a defect
    part is achieved by analyzing the divergence of the extracted feature values from
    their median related to the inspected area. Surfaces that contain an inconsistent
    texture will be rejected.
author:
- first_name: Marcus
  full_name: Niederhöfer, Marcus
  last_name: Niederhöfer
- first_name: Volker
  full_name: Lohweg, Volker
  id: '1804'
  last_name: Lohweg
  orcid: 0000-0002-3325-7887
citation:
  ama: 'Niederhöfer M, Lohweg V. Application-based Approach for Automatic Texture
    Defect Recognition on Synthetic Surfaces. In: <i>13th IEEE International Conference
    on Emerging Technologies and Factory Automation (ETFA 2008)</i>. Hamburg, Germany;
    2008. doi:<a href="https://doi.org/10.1109/ETFA.2008.4638397">10.1109/ETFA.2008.4638397</a>'
  apa: Niederhöfer, M., &#38; Lohweg, V. (2008). Application-based Approach for Automatic
    Texture Defect Recognition on Synthetic Surfaces. In <i>13th IEEE International
    Conference on Emerging Technologies and Factory Automation (ETFA 2008)</i>. Hamburg,
    Germany. <a href="https://doi.org/10.1109/ETFA.2008.4638397">https://doi.org/10.1109/ETFA.2008.4638397</a>
  bjps: <b>Niederhöfer M and Lohweg V</b> (2008) Application-Based Approach for Automatic
    Texture Defect Recognition on Synthetic Surfaces. <i>13th IEEE International Conference
    on Emerging Technologies and Factory Automation (ETFA 2008)</i>. Hamburg, Germany.
  chicago: Niederhöfer, Marcus, and Volker Lohweg. “Application-Based Approach for
    Automatic Texture Defect Recognition on Synthetic Surfaces.” In <i>13th IEEE International
    Conference on Emerging Technologies and Factory Automation (ETFA 2008)</i>. Hamburg,
    Germany, 2008. <a href="https://doi.org/10.1109/ETFA.2008.4638397">https://doi.org/10.1109/ETFA.2008.4638397</a>.
  chicago-de: 'Niederhöfer, Marcus und Volker Lohweg. 2008. Application-based Approach
    for Automatic Texture Defect Recognition on Synthetic Surfaces. In: <i>13th IEEE
    International Conference on Emerging Technologies and Factory Automation (ETFA
    2008)</i>. Hamburg, Germany. doi:<a href="https://doi.org/10.1109/ETFA.2008.4638397,">10.1109/ETFA.2008.4638397,</a>
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Niederhöfer, Marcus</span>
    ; <span style="font-variant:small-caps;">Lohweg, Volker</span>: Application-based
    Approach for Automatic Texture Defect Recognition on Synthetic Surfaces. In: <i>13th
    IEEE International Conference on Emerging Technologies and Factory Automation
    (ETFA 2008)</i>. Hamburg, Germany, 2008'
  havard: 'M. Niederhöfer, V. Lohweg, Application-based Approach for Automatic Texture
    Defect Recognition on Synthetic Surfaces, in: 13th IEEE International Conference
    on Emerging Technologies and Factory Automation (ETFA 2008), Hamburg, Germany,
    2008.'
  ieee: M. Niederhöfer and V. Lohweg, “Application-based Approach for Automatic Texture
    Defect Recognition on Synthetic Surfaces,” in <i>13th IEEE International Conference
    on Emerging Technologies and Factory Automation (ETFA 2008)</i>, 2008.
  mla: Niederhöfer, Marcus, and Volker Lohweg. “Application-Based Approach for Automatic
    Texture Defect Recognition on Synthetic Surfaces.” <i>13th IEEE International
    Conference on Emerging Technologies and Factory Automation (ETFA 2008)</i>, 2008,
    doi:<a href="https://doi.org/10.1109/ETFA.2008.4638397">10.1109/ETFA.2008.4638397</a>.
  short: 'M. Niederhöfer, V. Lohweg, in: 13th IEEE International Conference on Emerging
    Technologies and Factory Automation (ETFA 2008), Hamburg, Germany, 2008.'
  ufg: '<b>Niederhöfer, Marcus/Lohweg, Volker (2008)</b>: Application-based Approach
    for Automatic Texture Defect Recognition on Synthetic Surfaces, in: <i>13th IEEE
    International Conference on Emerging Technologies and Factory Automation (ETFA
    2008)</i>, Hamburg, Germany.'
  van: 'Niederhöfer M, Lohweg V. Application-based Approach for Automatic Texture
    Defect Recognition on Synthetic Surfaces. In: 13th IEEE International Conference
    on Emerging Technologies and Factory Automation (ETFA 2008). Hamburg, Germany;
    2008.'
date_created: 2019-11-29T14:22:03Z
date_updated: 2023-03-15T13:49:38Z
department:
- _id: DEP5023
doi: 10.1109/ETFA.2008.4638397
language:
- iso: eng
place: Hamburg, Germany
publication: 13th IEEE International Conference on Emerging Technologies and Factory
  Automation (ETFA 2008)
publication_status: published
status: public
title: Application-based Approach for Automatic Texture Defect Recognition on Synthetic
  Surfaces
type: conference
user_id: '45673'
year: 2008
...
---
_id: '2074'
abstract:
- lang: eng
  text: 'Veranstaltungsreihe quot;solution OWLquot;; '
author:
- first_name: Volker
  full_name: Lohweg, Volker
  id: '1804'
  last_name: Lohweg
  orcid: 0000-0002-3325-7887
citation:
  ama: 'Lohweg V. Intelligente Automation durch Sensorfusion, Adaptronik - Mediatronik
    - Kognitronik – Schlüssel für die Entwicklung intelligenter Systeme. In: Veranstaltungsreihe
    “solution OWL”, Claas Technoparc, Harsewinkel, 28.10.2008; 2008.'
  apa: Lohweg, V. (2008). Intelligente Automation durch Sensorfusion, Adaptronik -
    Mediatronik - Kognitronik – Schlüssel für die Entwicklung intelligenter Systeme.
    Veranstaltungsreihe “solution OWL”, Claas Technoparc, Harsewinkel, 28.10.2008.
  bjps: <b>Lohweg V</b> (2008) Intelligente Automation Durch Sensorfusion, Adaptronik
    - Mediatronik - Kognitronik – Schlüssel Für Die Entwicklung Intelligenter Systeme.
    Veranstaltungsreihe ‘solution OWL’, Claas Technoparc, Harsewinkel, 28.10.2008.
  chicago: Lohweg, Volker. “Intelligente Automation Durch Sensorfusion, Adaptronik
    - Mediatronik - Kognitronik – Schlüssel Für Die Entwicklung Intelligenter Systeme.”
    Veranstaltungsreihe “solution OWL”, Claas Technoparc, Harsewinkel, 28.10.2008,
    2008.
  chicago-de: 'Lohweg, Volker. 2008. Intelligente Automation durch Sensorfusion, Adaptronik
    - Mediatronik - Kognitronik – Schlüssel für die Entwicklung intelligenter Systeme.
    In: . Veranstaltungsreihe „solution OWL“, Claas Technoparc, Harsewinkel, 28.10.2008.'
  din1505-2-1: '<span style="font-variant:small-caps;">Lohweg, Volker</span>: Intelligente
    Automation durch Sensorfusion, Adaptronik - Mediatronik - Kognitronik – Schlüssel
    für die Entwicklung intelligenter Systeme. In:  : Veranstaltungsreihe „solution
    OWL“, Claas Technoparc, Harsewinkel, 28.10.2008, 2008'
  havard: 'V. Lohweg, Intelligente Automation durch Sensorfusion, Adaptronik - Mediatronik
    - Kognitronik – Schlüssel für die Entwicklung intelligenter Systeme, in: Veranstaltungsreihe
    “solution OWL”, Claas Technoparc, Harsewinkel, 28.10.2008, 2008.'
  ieee: V. Lohweg, “Intelligente Automation durch Sensorfusion, Adaptronik - Mediatronik
    - Kognitronik – Schlüssel für die Entwicklung intelligenter Systeme,” 2008.
  mla: Lohweg, Volker. <i>Intelligente Automation Durch Sensorfusion, Adaptronik -
    Mediatronik - Kognitronik – Schlüssel Für Die Entwicklung Intelligenter Systeme</i>.
    Veranstaltungsreihe “solution OWL”, Claas Technoparc, Harsewinkel, 28.10.2008,
    2008.
  short: 'V. Lohweg, in: Veranstaltungsreihe “solution OWL”, Claas Technoparc, Harsewinkel,
    28.10.2008, 2008.'
  ufg: '<b>Lohweg, Volker (2008)</b>: Intelligente Automation durch Sensorfusion,
    Adaptronik - Mediatronik - Kognitronik – Schlüssel für die Entwicklung intelligenter
    Systeme, in: .'
  van: Lohweg V. Intelligente Automation durch Sensorfusion, Adaptronik - Mediatronik
    - Kognitronik – Schlüssel für die Entwicklung intelligenter Systeme. In Veranstaltungsreihe
    “solution OWL”, Claas Technoparc, Harsewinkel, 28.10.2008; 2008.
date_created: 2019-11-29T14:25:52Z
date_updated: 2023-03-15T13:49:38Z
department:
- _id: DEP5023
language:
- iso: eng
publisher: Veranstaltungsreihe "solution OWL", Claas Technoparc, Harsewinkel, 28.10.2008
status: public
title: Intelligente Automation durch Sensorfusion, Adaptronik - Mediatronik - Kognitronik
  – Schlüssel für die Entwicklung intelligenter Systeme
type: conference
user_id: '45673'
year: 2008
...