3 Publikationen
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 9204
Kolmer, Philipp, Abhay Rammurti Shukla, and Jian Song. “Methods of Material and Surface Analysis for the Evaluation of Failure Modes for Electrical Connectors.” Technologies : Open Access Journal 10, no. 6 (2022): 124. https://doi.org/10.3390/technologies10060124.
ELSA
| DOI
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 9206
Song, Jian, Abhay Rammurti Shukla, and Roman Probst. “Prediction of Failure in Time (FIT) of Electrical Connectors with Short Term Tests.” Microelectronics Reliability : An Internat. Journal & World Abstracting Service 138, no. November 2022 (2022). https://doi.org/10.1016/j.microrel.2022.114684.
ELSA
| DOI
2022 | Konferenzband - Beitrag | ELSA-ID: 9211
Song, Jian, Abhay Rammurti Shukla, and Roman Probst. State of Health of Connectors – Early Indicators. Electrical Contacts - 2022 : Proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts. Piscataway, NJ: IEEE, 2022. https://doi.org/10.1109/HLM54538.2022.9969839.
ELSA
| DOI
Suche
Publikationen filtern
Darstellung / Sortierung
Export / Einbettung
3 Publikationen
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 9204
Kolmer, Philipp, Abhay Rammurti Shukla, and Jian Song. “Methods of Material and Surface Analysis for the Evaluation of Failure Modes for Electrical Connectors.” Technologies : Open Access Journal 10, no. 6 (2022): 124. https://doi.org/10.3390/technologies10060124.
ELSA
| DOI
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 9206
Song, Jian, Abhay Rammurti Shukla, and Roman Probst. “Prediction of Failure in Time (FIT) of Electrical Connectors with Short Term Tests.” Microelectronics Reliability : An Internat. Journal & World Abstracting Service 138, no. November 2022 (2022). https://doi.org/10.1016/j.microrel.2022.114684.
ELSA
| DOI
2022 | Konferenzband - Beitrag | ELSA-ID: 9211
Song, Jian, Abhay Rammurti Shukla, and Roman Probst. State of Health of Connectors – Early Indicators. Electrical Contacts - 2022 : Proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts. Piscataway, NJ: IEEE, 2022. https://doi.org/10.1109/HLM54538.2022.9969839.
ELSA
| DOI