---
res:
  bibo_abstract:
  - Lifetime is an important feature defining the reliability of electrical connectors.
    In general practice, the lifetime tests required for reliability estimation are
    time and labor intensive. In our previous work, a data driven method using a statistical
    process, with an application of probability distributions such as standard normal
    distribution and generalized extreme value (GEV) distribution with negative skewness
    to predict degradation paths, was introduced for estimation of the lifetime and
    FIT rate with the help of electrical contact resistance data collected from short
    term tests. The proposed method proved its significance by showing the possibility
    of drastic reduction in the lifetime test duration required for reliability determination.
    In this work, a non-parametric distribution free method using percentiles of actual
    measured contact resistances is used for determining the lifetime as against the
    percentiles of probability distribution used in previous work, thereby simplifying
    the process further and leading to an even more precise estimation. The lifetimes
    calculated from parametric and non-parametric methods are compared to highlight
    the significance of distribution free method in reliability estimation.@eng
  bibo_authorlist:
  - foaf_Person:
      foaf_givenName: Abhay Rammurti
      foaf_name: Shukla, Abhay Rammurti
      foaf_surname: Shukla
      foaf_workInfoHomepage: http://www.librecat.org/personId=74188
  - foaf_Person:
      foaf_givenName: Robert
      foaf_name: Martin, Robert
      foaf_surname: Martin
  - foaf_Person:
      foaf_givenName: Roman
      foaf_name: Probst, Roman
      foaf_surname: Probst
      foaf_workInfoHomepage: http://www.librecat.org/personId=69156
  - foaf_Person:
      foaf_givenName: Jian
      foaf_name: Song, Jian
      foaf_surname: Song
      foaf_workInfoHomepage: http://www.librecat.org/personId=5297
  bibo_doi: 10.1016/j.microrel.2023.115216
  bibo_volume: 150
  dct_date: 2023^xs_gYear
  dct_identifier:
  - UT:001106942700001
  dct_isPartOf:
  - http://id.crossref.org/issn/0026-2714
  dct_language: eng
  dct_publisher: Elsevier @
  dct_subject:
  - Electrical and Electronic Engineering
  - Surfaces
  - Coatings and Films
  - Safety
  - Risk
  - Reliability and Quality
  - Condensed Matter Physics
  - Atomic and Molecular Physics
  - and Optics
  - Electronic
  - Optical and Magnetic Materials
  dct_title: Comparison of different statistical methods for prediction of lifetime
    of electrical connectors with short term tests@
...