---
res:
  bibo_abstract:
  - Various degradation mechanisms can diminish the performance of electrical connectors
    in automobiles over time. It is crucial to gain an in-depth understanding of the
    failure mechanisms and their interactions, as well as to systematically analyze
    the failure mechanisms of connectors, assess their state of health, and predict
    the probability of failure in the future. This work provides a comprehensive overview
    of degradation mechanisms in electrical connectors, including fretting corrosion,
    oxidation, delamination, wear through of the protective coating, stress relaxation
    and plastic deformation. It focuses on mechanisms that contribute to increased
    contact resistance over time and proposes a unified model to explain their interactions.
    The study introduces a structured methodology for assessing connector health by
    outlining key measurement techniques and presenting an efficient approach to failure
    and state analysis that minimizes both testing time and sample size. This methodology
    is supported by analyses of connectors from long-term life tests and field-used,
    field-tested vehicles. Additionally, the study explores new aspects of the state
    analysis for accelerated testing of connectors, supported by examples from field-tested
    vehicles and various test methods, to predict connectors lifetime and evaluate
    the effectiveness of existing testing approaches.@eng
  bibo_authorlist:
  - foaf_Person:
      foaf_givenName: Jian
      foaf_name: Song, Jian
      foaf_surname: Song
      foaf_workInfoHomepage: http://www.librecat.org/personId=5297
  - foaf_Person:
      foaf_givenName: Dirk
      foaf_name: Hilmert, Dirk
      foaf_surname: Hilmert
      foaf_workInfoHomepage: http://www.librecat.org/personId=74212
  - foaf_Person:
      foaf_givenName: Frederik
      foaf_name: Kiel, Frederik
      foaf_surname: Kiel
      foaf_workInfoHomepage: http://www.librecat.org/personId=87296
  bibo_doi: 10.1016/j.engfailanal.2025.109427
  bibo_issue: '5'
  bibo_volume: 173
  dct_date: 2025^xs_gYear
  dct_identifier:
  - UT:001431374000001
  dct_isPartOf:
  - http://id.crossref.org/issn/1350-6307
  - http://id.crossref.org/issn/1873-1961
  dct_language: eng
  dct_publisher: Elsevier@
  dct_subject:
  - Combined failure mechanisms
  - Combination of analytical methods
  - Procedure of analysis
  dct_title: Mechanisms of failure and state analysis of electrical connectors in
    automobiles@
...