{"publication_status":"published","citation":{"havard":"M. Ehrlich, A. Bröring, C. Diedrich, J. Jasperneite, W. Kastner, H. Trsek, Determining the Target Security Level for Automated Security Risk Assessments, IEEE, [Piscataway, NJ], 2023.","ieee":"M. Ehrlich, A. Bröring, C. Diedrich, J. Jasperneite, W. Kastner, and H. Trsek, Determining the Target Security Level for Automated Security Risk Assessments. [Piscataway, NJ]: IEEE, 2023. doi: 10.1109/indin51400.2023.10217902.","ufg":"Ehrlich, Marco u. a.: Determining the Target Security Level for Automated Security Risk Assessments, hg. von Jasperneite, Jürgen, Institute of Electrical and Electronics Engineers, [Piscataway, NJ] 2023.","chicago":"Ehrlich, Marco, Andre Bröring, Christian Diedrich, Jürgen Jasperneite, Wolfgang Kastner, and Henning Trsek. Determining the Target Security Level for Automated Security Risk Assessments. Edited by Jürgen Jasperneite and Institute of Electrical and Electronics Engineers. 2023 IEEE 21st International Conference on Industrial Informatics : INDIN 2023 : 17-20 July 2023, Lemgo, Germany. [Piscataway, NJ]: IEEE, 2023. https://doi.org/10.1109/indin51400.2023.10217902.","din1505-2-1":"Ehrlich, Marco ; Bröring, Andre ; Diedrich, Christian ; Jasperneite, Jürgen ; Kastner, Wolfgang ; Trsek, Henning ; Jasperneite, J. ; Institute of Electrical and Electronics Engineers (Hrsg.): Determining the Target Security Level for Automated Security Risk Assessments. [Piscataway, NJ] : IEEE, 2023","ama":"Ehrlich M, Bröring A, Diedrich C, Jasperneite J, Kastner W, Trsek H. Determining the Target Security Level for Automated Security Risk Assessments. (Jasperneite J, Institute of Electrical and Electronics Engineers, eds.). IEEE; 2023. doi:10.1109/indin51400.2023.10217902","bjps":"Ehrlich M et al. (2023) Determining the Target Security Level for Automated Security Risk Assessments, Jasperneite J and Institute of Electrical and Electronics Engineers (eds). [Piscataway, NJ]: IEEE.","mla":"Ehrlich, Marco, et al. “Determining the Target Security Level for Automated Security Risk Assessments.” 2023 IEEE 21st International Conference on Industrial Informatics : INDIN 2023 : 17-20 July 2023, Lemgo, Germany, edited by Jürgen Jasperneite and Institute of Electrical and Electronics Engineers, IEEE, 2023, https://doi.org/10.1109/indin51400.2023.10217902.","van":"Ehrlich M, Bröring A, Diedrich C, Jasperneite J, Kastner W, Trsek H. Determining the Target Security Level for Automated Security Risk Assessments. Jasperneite J, Institute of Electrical and Electronics Engineers, editors. 2023 IEEE 21st International Conference on Industrial Informatics : INDIN 2023 : 17-20 July 2023, Lemgo, Germany. [Piscataway, NJ]: IEEE; 2023.","apa":"Ehrlich, M., Bröring, A., Diedrich, C., Jasperneite, J., Kastner, W., & Trsek, H. (2023). Determining the Target Security Level for Automated Security Risk Assessments. In J. Jasperneite & Institute of Electrical and Electronics Engineers (Eds.), 2023 IEEE 21st International Conference on Industrial Informatics : INDIN 2023 : 17-20 July 2023, Lemgo, Germany. IEEE. https://doi.org/10.1109/indin51400.2023.10217902","short":"M. Ehrlich, A. Bröring, C. Diedrich, J. Jasperneite, W. Kastner, H. Trsek, Determining the Target Security Level for Automated Security Risk Assessments, IEEE, [Piscataway, NJ], 2023.","chicago-de":"Ehrlich, Marco, Andre Bröring, Christian Diedrich, Jürgen Jasperneite, Wolfgang Kastner und Henning Trsek. 2023. Determining the Target Security Level for Automated Security Risk Assessments. Hg. von Jürgen Jasperneite und Institute of Electrical and Electronics Engineers. 2023 IEEE 21st International Conference on Industrial Informatics : INDIN 2023 : 17-20 July 2023, Lemgo, Germany. [Piscataway, NJ]: IEEE. doi:10.1109/indin51400.2023.10217902, ."},"keyword":["Integrated circuits","Industries","Libraries","Security","Risk management","IEC Standards","Interviews"],"conference":{"location":"Lemgo","start_date":"2023-07-18","name":"21st International Conference on Industrial Informatics (INDIN)","end_date":"2023-07-20"},"language":[{"iso":"eng"}],"corporate_editor":["Institute of Electrical and Electronics Engineers"],"place":"[Piscataway, NJ]","abstract":[{"lang":"eng","text":"Due to Industry 4.0 developments, the demanded modularity of manufacturing systems generates additional manual efforts for security experts to guarantee a secure operation. The rising utilization of information and the frequent changes of system structures necessitate a continuous and automated security engineering, especially by application of the mandatory security risk assessments. Collecting the required information for these assessments and formalising expert knowledge shall improve the security of modular manufacturing systems in the future. In order to automate the security risk assessment process, this work proposes a method to determine the Target Security Level (SL-T) in conformance to the IEC 62443 standard based on the MITRE ATT&CK framework and the Intel Threat Agent Library (TAL)."}],"publisher":"IEEE","_id":"12995","department":[{"_id":"DEP5023"}],"date_updated":"2025-06-18T13:37:07Z","year":"2023","publication":"2023 IEEE 21st International Conference on Industrial Informatics : INDIN 2023 : 17-20 July 2023, Lemgo, Germany","type":"conference_editor_article","title":"Determining the Target Security Level for Automated Security Risk Assessments","status":"public","date_created":"2025-06-18T13:30:31Z","publication_identifier":{"isbn":["978-1-6654-9314-7"],"eisbn":["978-1-6654-9313-0"]},"author":[{"id":"61562","last_name":"Ehrlich","full_name":"Ehrlich, Marco","first_name":"Marco"},{"first_name":"Andre","id":"65130","full_name":"Bröring, Andre","last_name":"Bröring"},{"full_name":"Diedrich, Christian","last_name":"Diedrich","first_name":"Christian"},{"last_name":"Jasperneite","id":"1899","full_name":"Jasperneite, Jürgen","first_name":"Jürgen"},{"last_name":"Kastner","full_name":"Kastner, Wolfgang","first_name":"Wolfgang"},{"orcid":"0000-0002-0133-0656","first_name":"Henning","last_name":"Trsek","id":"1486","full_name":"Trsek, Henning"}],"user_id":"83781","doi":"10.1109/indin51400.2023.10217902","editor":[{"last_name":"Jasperneite","id":"1899","full_name":"Jasperneite, Jürgen","first_name":"Jürgen"}]}