---
_id: '2005'
abstract:
- lang: eng
  text: We present a method for the fast and robust linear classification of badly
    conditioned data. In our considerations, badly conditioned data are such data
    which are numerically difficult to handle. Due to, e.g. a large number of features
    or a large number of objects representing classes as well as noise, outliers or
    incompleteness, the common software computation of the discriminating linear combination
    of features between classes fails or is extremely time consuming. The theoretical
    foundations of our approach are based on the single feature ranking, which allows
    fast calculation of the approximative initial classification boundary. For the
    increasing of classification accuracy of this boundary, the refinement is performed
    in the lower dimensional space. Our approach is tested on several datasets from
    UCI Reposi-tiory. Experimental results indicate high classification accuracy of
    the approach. For the modern real industrial applications such a method is especially
    suitable in the Cyber-Physical-System environments and provides a part of the
    workflow for the automated classifier design
author:
- first_name: Helene
  full_name: Dörksen, Helene
  id: '46416'
  last_name: Dörksen
- first_name: Volker
  full_name: Lohweg, Volker
  id: '1804'
  last_name: Lohweg
  orcid: 0000-0002-3325-7887
citation:
  ama: 'Dörksen H, Lohweg V. Linear Classification of Badly Conditioned Data. . In:
    <i>23rd IEEE International Conference on Emerging Technologies and Factory Automation
    (ETFA)</i>. Torino, Italy; 2018. doi:<a href="https://doi.org/10.1109/ETFA.2018.8502485">10.1109/ETFA.2018.8502485</a>'
  apa: Dörksen, H., &#38; Lohweg, V. (2018). Linear Classification of Badly Conditioned
    Data. . In <i>23rd IEEE International Conference on Emerging Technologies and
    Factory Automation (ETFA)</i>. Torino, Italy. <a href="https://doi.org/10.1109/ETFA.2018.8502485">https://doi.org/10.1109/ETFA.2018.8502485</a>
  bjps: <b>Dörksen H and Lohweg V</b> (2018) Linear Classification of Badly Conditioned
    Data. . <i>23rd IEEE International Conference on Emerging Technologies and Factory
    Automation (ETFA)</i>. Torino, Italy.
  chicago: Dörksen, Helene, and Volker Lohweg. “Linear Classification of Badly Conditioned
    Data. .” In <i>23rd IEEE International Conference on Emerging Technologies and
    Factory Automation (ETFA)</i>. Torino, Italy, 2018. <a href="https://doi.org/10.1109/ETFA.2018.8502485">https://doi.org/10.1109/ETFA.2018.8502485</a>.
  chicago-de: 'Dörksen, Helene und Volker Lohweg. 2018. Linear Classification of Badly
    Conditioned Data. . In: <i>23rd IEEE International Conference on Emerging Technologies
    and Factory Automation (ETFA)</i>. Torino, Italy. doi:<a href="https://doi.org/10.1109/ETFA.2018.8502485,">10.1109/ETFA.2018.8502485,</a>
    .'
  din1505-2-1: '<span style="font-variant:small-caps;">Dörksen, Helene</span> ; <span
    style="font-variant:small-caps;">Lohweg, Volker</span>: Linear Classification
    of Badly Conditioned Data. . In: <i>23rd IEEE International Conference on Emerging
    Technologies and Factory Automation (ETFA)</i>. Torino, Italy, 2018'
  havard: 'H. Dörksen, V. Lohweg, Linear Classification of Badly Conditioned Data.
    , in: 23rd IEEE International Conference on Emerging Technologies and Factory
    Automation (ETFA), Torino, Italy, 2018.'
  ieee: H. Dörksen and V. Lohweg, “Linear Classification of Badly Conditioned Data.
    ,” in <i>23rd IEEE International Conference on Emerging Technologies and Factory
    Automation (ETFA)</i>,  Turin, Italy , 2018.
  mla: Dörksen, Helene, and Volker Lohweg. “Linear Classification of Badly Conditioned
    Data. .” <i>23rd IEEE International Conference on Emerging Technologies and Factory
    Automation (ETFA)</i>, 2018, doi:<a href="https://doi.org/10.1109/ETFA.2018.8502485">10.1109/ETFA.2018.8502485</a>.
  short: 'H. Dörksen, V. Lohweg, in: 23rd IEEE International Conference on Emerging
    Technologies and Factory Automation (ETFA), Torino, Italy, 2018.'
  ufg: '<b>Dörksen, Helene/Lohweg, Volker (2018)</b>: Linear Classification of Badly
    Conditioned Data. , in: <i>23rd IEEE International Conference on Emerging Technologies
    and Factory Automation (ETFA)</i>, Torino, Italy.'
  van: 'Dörksen H, Lohweg V. Linear Classification of Badly Conditioned Data. . In:
    23rd IEEE International Conference on Emerging Technologies and Factory Automation
    (ETFA). Torino, Italy; 2018.'
conference:
  end_date: 2018-09-07
  location: ' Turin, Italy '
  name: ' IEEE 23rd International Conference on Emerging Technologies and Factory
    Automation (ETFA) 2018'
  start_date: 2018-09-04
date_created: 2019-11-25T08:35:44Z
date_updated: 2023-03-15T13:49:38Z
department:
- _id: DEP5023
doi: 10.1109/ETFA.2018.8502485
keyword:
- Task analysis
- Software
- Linear discriminant analysis
- Dimensionality reduction
- Mathematical model
- Covariance matrices
- Measurement
language:
- iso: eng
main_file_link:
- open_access: '1'
  url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8502485
oa: '1'
place: Torino, Italy
publication: 23rd IEEE International Conference on Emerging Technologies and Factory
  Automation (ETFA)
status: public
title: 'Linear Classification of Badly Conditioned Data. '
type: conference
user_id: '15514'
year: 2018
...