{"abstract":[{"text":"Nonlinear spatial transforms and fuzzy pattern classification with unimodal potential functions are already established in signal processing. They have proved to be excellent tools in feature extraction and classification. We propose an inspection method for pattern recognition and classification of two dimensional translation variant security elements such as stripes, kinegrams and others, which are widely used as applications in bank note printing. The system is based on discrete non linear translation invariant circular transforms and fuzzy pattern classification. Nonlinear discrete circular transforms are adaptable transforms, which can be optimized for different application tasks, such as translation variant object analysis and position location. They are mainly used as generators for feature vectors. Even though, the feature vector is theoretically translation invariant, the object movement creates a translation tolerant feature vector, because in real systems and applications many problems can occur, such as signal and optical distortions. Therefore, the features should be further analysed by a fuzzy pattern classifier. Implementation of the transforms and fuzzy pattern classifier in radix-2-structures is possible, allowing fast calculations with a computational complexity of O(N) up to O(Nld(N)). Furthermore, the algorithms can be implemented in one Field Programmable Gate Array (FPGA), which operates with 40 MHz clock rate.","lang":"eng"}],"_id":"2055","author":[{"full_name":"Türke, Thomas","last_name":"Türke","first_name":"Thomas"},{"last_name":"Lohweg","full_name":"Lohweg, Volker","id":"1804","orcid":"0000-0002-3325-7887","first_name":"Volker"}],"publication_status":"published","status":"public","place":"San José","doi":"dx.doi.org/10.1117/12.527452","type":"conference","editor":[{"full_name":"Nasser Kehtarnavaz, Phillip A. Laplante","last_name":"Nasser Kehtarnavaz","first_name":"Phillip A. Laplante"}],"language":[{"iso":"eng"}],"date_created":"2019-11-29T13:05:16Z","publisher":"SPIE","year":2004,"date_updated":"2023-03-15T13:49:38Z","page":"204-211","citation":{"mla":"Türke, Thomas, and Volker Lohweg. “Real-Time Image-Processing-System-on-Chip for Security Feature Detection and Classification.” <i>IST/SPIE 16th Annual Symposium on Electronic Imaging - Real-Time Imaging VIII - Vol 5297</i>, edited by Phillip A. Laplante Nasser Kehtarnavaz, SPIE, 2004, pp. 204–11, doi:<a href=\"https://doi.org/dx.doi.org/10.1117/12.527452\">dx.doi.org/10.1117/12.527452</a>.","chicago":"Türke, Thomas, and Volker Lohweg. “Real-Time Image-Processing-System-on-Chip for Security Feature Detection and Classification.” In <i>IST/SPIE 16th Annual Symposium on Electronic Imaging - Real-Time Imaging VIII - Vol 5297</i>, edited by Phillip A. Laplante Nasser Kehtarnavaz, 204–11. San José: SPIE, 2004. <a href=\"https://doi.org/dx.doi.org/10.1117/12.527452\">https://doi.org/dx.doi.org/10.1117/12.527452</a>.","chicago-de":"Türke, Thomas und Volker Lohweg. 2004. Real-time image-processing-system-on-chip for security feature detection and classification. In: <i>IST/SPIE 16th Annual Symposium on Electronic Imaging - Real-Time Imaging VIII - Vol 5297</i>, hg. von Phillip A. Laplante Nasser Kehtarnavaz, 204–211. San José: SPIE. doi:<a href=\"https://doi.org/dx.doi.org/10.1117/12.527452,\">dx.doi.org/10.1117/12.527452,</a> .","din1505-2-1":"<span style=\"font-variant:small-caps;\">Türke, Thomas</span> ; <span style=\"font-variant:small-caps;\">Lohweg, Volker</span>: Real-time image-processing-system-on-chip for security feature detection and classification. In: <span style=\"font-variant:small-caps;\">Nasser Kehtarnavaz, P. A. L.</span> (Hrsg.): <i>IST/SPIE 16th Annual Symposium on Electronic Imaging - Real-Time Imaging VIII - Vol 5297</i>. San José : SPIE, 2004, S. 204–211","havard":"T. Türke, V. Lohweg, Real-time image-processing-system-on-chip for security feature detection and classification, in: P.A.L. Nasser Kehtarnavaz (Ed.), IST/SPIE 16th Annual Symposium on Electronic Imaging - Real-Time Imaging VIII - Vol 5297, SPIE, San José, 2004: pp. 204–211.","van":"Türke T, Lohweg V. Real-time image-processing-system-on-chip for security feature detection and classification. In: Nasser Kehtarnavaz PAL, editor. IST/SPIE 16th Annual Symposium on Electronic Imaging - Real-Time Imaging VIII - Vol 5297. San José: SPIE; 2004. p. 204–11.","bjps":"<b>Türke T and Lohweg V</b> (2004) Real-Time Image-Processing-System-on-Chip for Security Feature Detection and Classification. In Nasser Kehtarnavaz PAL (ed.), <i>IST/SPIE 16th Annual Symposium on Electronic Imaging - Real-Time Imaging VIII - Vol 5297</i>. San José: SPIE, pp. 204–211.","ufg":"<b>Türke, Thomas/Lohweg, Volker (2004)</b>: Real-time image-processing-system-on-chip for security feature detection and classification, in: Phillip A. Laplante Nasser Kehtarnavaz (Hg.): <i>IST/SPIE 16th Annual Symposium on Electronic Imaging - Real-Time Imaging VIII - Vol 5297</i>, San José, S. 204–211.","ieee":"T. Türke and V. Lohweg, “Real-time image-processing-system-on-chip for security feature detection and classification,” in <i>IST/SPIE 16th Annual Symposium on Electronic Imaging - Real-Time Imaging VIII - Vol 5297</i>, 2004, pp. 204–211.","short":"T. Türke, V. Lohweg, in: P.A.L. Nasser Kehtarnavaz (Ed.), IST/SPIE 16th Annual Symposium on Electronic Imaging - Real-Time Imaging VIII - Vol 5297, SPIE, San José, 2004, pp. 204–211.","ama":"Türke T, Lohweg V. Real-time image-processing-system-on-chip for security feature detection and classification. In: Nasser Kehtarnavaz PAL, ed. <i>IST/SPIE 16th Annual Symposium on Electronic Imaging - Real-Time Imaging VIII - Vol 5297</i>. San José: SPIE; 2004:204-211. doi:<a href=\"https://doi.org/dx.doi.org/10.1117/12.527452\">dx.doi.org/10.1117/12.527452</a>","apa":"Türke, T., &#38; Lohweg, V. (2004). Real-time image-processing-system-on-chip for security feature detection and classification. In P. A. L. Nasser Kehtarnavaz (Ed.), <i>IST/SPIE 16th Annual Symposium on Electronic Imaging - Real-Time Imaging VIII - Vol 5297</i> (pp. 204–211). San José: SPIE. <a href=\"https://doi.org/dx.doi.org/10.1117/12.527452\">https://doi.org/dx.doi.org/10.1117/12.527452</a>"},"department":[{"_id":"DEP5023"}],"publication":"IST/SPIE 16th Annual Symposium on Electronic Imaging - Real-Time Imaging VIII - Vol 5297","title":"Real-time image-processing-system-on-chip for security feature detection and classification","user_id":"45673"}