{"year":"2019","date_updated":"2025-04-17T06:33:42Z","date_created":"2021-01-28T14:47:12Z","conference":{"location":"Lisbon, PORTUGAL","end_date":"2019-10-19","name":"45th Annual Conference of the IEEE Industrial Electronics Society (IECON)","start_date":"2019-10-14"},"status":"public","type":"conference","_id":"4756","abstract":[{"lang":"eng","text":"Due to the dynamic nature of the Industrie 4.0 developments, future production systems will be reconfigured more frequently and new system configurations will be deployed automatically. In order to keep pace with this development, it will be required to observe and ensure the needed security functionalities and corresponding certifications in an automated way. This implies an improvement of today's static procedures and manual efforts as much as possible in favor of a dynamic standard establishment. Therefore, this paper evaluates the state of the art of the industrial security standardization landscape and proposes a concept for the automated support of certification processes with information from industrial communication networks in order to enhance the usability of the standards establishments and the certifications within organizations and companies, especially small and medium-sized enterprises."}],"series_title":"IEEE Industrial Electronics Society","user_id":"83781","title":"Survey of Security Standards for an automated Industrie 4.0 compatible Manufacturing","publication":"IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society (IES)","page":"2849-2854","department":[{"_id":"DEP5023"},{"_id":"DEP5019"}],"language":[{"iso":"eng"}],"publisher":"IEEE","keyword":["Industrial Automation","Security","Toolchain","Standardization","Communication Networks"],"place":"[Piscataway, NJ]","publication_status":"published","author":[{"id":"61562","full_name":"Ehrlich, Marco","last_name":"Ehrlich","first_name":"Marco"},{"first_name":"Henning","orcid":"0000-0002-0133-0656","full_name":"Trsek, Henning","last_name":"Trsek","id":"1486"},{"id":"1710","last_name":"Wisniewski","full_name":"Wisniewski, Lukasz","first_name":"Lukasz"},{"id":"1899","last_name":"Jasperneite","full_name":"Jasperneite, Jürgen","first_name":"Jürgen"}],"corporate_editor":[" IEEE Industrial Electronics Society. Annual Conference ","IEEE Industrial Electronics Society ","Universidade Nova de Lisboa ","Institute of Electrical and Electronics Engineers"],"external_id":{"isi":["WOS:000522050602140"]},"publication_identifier":{"issn":["1553-572X"],"isbn":["978-1-7281-4879-3"],"eisbn":["978-1-7281-4878-6"]},"citation":{"din1505-2-1":"<span style=\"font-variant:small-caps;\">Ehrlich, Marco</span> ; <span style=\"font-variant:small-caps;\">Trsek, Henning</span> ; <span style=\"font-variant:small-caps;\">Wisniewski, Lukasz</span> ; <span style=\"font-variant:small-caps;\">Jasperneite, Jürgen</span>: Survey of Security Standards for an automated Industrie 4.0 compatible Manufacturing. In: <span style=\"font-variant:small-caps;\"> IEEE Industrial Electronics Society. Annual Conference </span> ; <span style=\"font-variant:small-caps;\">IEEE Industrial Electronics Society </span> ; <span style=\"font-variant:small-caps;\">Universidade Nova de Lisboa </span> ; <span style=\"font-variant:small-caps;\">Institute of Electrical and Electronics Engineers</span> (Hrsg.): <i>IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society (IES)</i>, <i>IEEE Industrial Electronics Society</i>. [Piscataway, NJ] : IEEE, 2019, S. 2849–2854","chicago-de":"Ehrlich, Marco, Henning Trsek, Lukasz Wisniewski und Jürgen Jasperneite. 2019. Survey of Security Standards for an automated Industrie 4.0 compatible Manufacturing. In: <i>IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society (IES)</i>, hg. von  IEEE Industrial Electronics Society. Annual Conference , IEEE Industrial Electronics Society , Universidade Nova de Lisboa , und Institute of Electrical and Electronics Engineers, 2849–2854. IEEE Industrial Electronics Society. [Piscataway, NJ]: IEEE.","apa":"Ehrlich, M., Trsek, H., Wisniewski, L., &#38; Jasperneite, J. (2019). Survey of Security Standards for an automated Industrie 4.0 compatible Manufacturing. In  IEEE Industrial Electronics Society. Annual Conference , IEEE Industrial Electronics Society , Universidade Nova de Lisboa , &#38; Institute of Electrical and Electronics Engineers (Eds.), <i>IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society (IES)</i> (pp. 2849–2854). IEEE.","ama":"Ehrlich M, Trsek H, Wisniewski L, Jasperneite J. Survey of Security Standards for an automated Industrie 4.0 compatible Manufacturing. In:  IEEE Industrial Electronics Society. Annual Conference , IEEE Industrial Electronics Society , Universidade Nova de Lisboa , Institute of Electrical and Electronics Engineers, eds. <i>IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society (IES)</i>. IEEE Industrial Electronics Society. IEEE; 2019:2849-2854.","chicago":"Ehrlich, Marco, Henning Trsek, Lukasz Wisniewski, and Jürgen Jasperneite. “Survey of Security Standards for an Automated Industrie 4.0 Compatible Manufacturing.” In <i>IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society (IES)</i>, edited by  IEEE Industrial Electronics Society. Annual Conference , IEEE Industrial Electronics Society , Universidade Nova de Lisboa , and Institute of Electrical and Electronics Engineers, 2849–54. IEEE Industrial Electronics Society. [Piscataway, NJ]: IEEE, 2019.","ieee":"M. Ehrlich, H. Trsek, L. Wisniewski, and J. Jasperneite, “Survey of Security Standards for an automated Industrie 4.0 compatible Manufacturing,” in <i>IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society (IES)</i>, Lisbon, PORTUGAL, 2019, pp. 2849–2854.","short":"M. Ehrlich, H. Trsek, L. Wisniewski, J. Jasperneite, in:  IEEE Industrial Electronics Society. Annual Conference , IEEE Industrial Electronics Society , Universidade Nova de Lisboa , Institute of Electrical and Electronics Engineers (Eds.), IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society (IES), IEEE, [Piscataway, NJ], 2019, pp. 2849–2854.","ufg":"<b>Ehrlich, Marco u. a.</b>: Survey of Security Standards for an automated Industrie 4.0 compatible Manufacturing, in: <i> IEEE Industrial Electronics Society. Annual Conference  u. a. (Hgg.)</i>: IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society (IES), [Piscataway, NJ] 2019 (IEEE Industrial Electronics Society),  S. 2849–2854.","bjps":"<b>Ehrlich M <i>et al.</i></b> (2019) Survey of Security Standards for an Automated Industrie 4.0 Compatible Manufacturing. In  IEEE Industrial Electronics Society. Annual Conference  et al. (eds), <i>IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society (IES)</i>. [Piscataway, NJ]: IEEE, pp. 2849–2854.","mla":"Ehrlich, Marco, et al. “Survey of Security Standards for an Automated Industrie 4.0 Compatible Manufacturing.” <i>IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society (IES)</i>, edited by  IEEE Industrial Electronics Society. Annual Conference  et al., IEEE, 2019, pp. 2849–54.","van":"Ehrlich M, Trsek H, Wisniewski L, Jasperneite J. Survey of Security Standards for an automated Industrie 4.0 compatible Manufacturing. In:  IEEE Industrial Electronics Society. Annual Conference , IEEE Industrial Electronics Society , Universidade Nova de Lisboa , Institute of Electrical and Electronics Engineers, editors. IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society (IES). [Piscataway, NJ]: IEEE; 2019. p. 2849–54. (IEEE Industrial Electronics Society).","havard":"M. Ehrlich, H. Trsek, L. Wisniewski, J. Jasperneite, Survey of Security Standards for an automated Industrie 4.0 compatible Manufacturing, in:  IEEE Industrial Electronics Society. Annual Conference , IEEE Industrial Electronics Society , Universidade Nova de Lisboa , Institute of Electrical and Electronics Engineers (Eds.), IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society (IES), IEEE, [Piscataway, NJ], 2019: pp. 2849–2854."}}