{"place":"Hawaii, USA","status":"public","type":"conference","_id":"4785","author":[{"full_name":"Bunte, Andreas","last_name":"Bunte","id":"58885","first_name":"Andreas"},{"first_name":"Benno","last_name":"Stein","full_name":"Stein, Benno"},{"last_name":"Niggemann","full_name":"Niggemann, Oliver","id":"10876","first_name":"Oliver"}],"year":2019,"date_updated":"2023-03-15T13:49:55Z","language":[{"iso":"eng"}],"publisher":"Thirty-Third AAAI Conference on Artificial Intelligence (AAAI-19)","date_created":"2021-02-02T08:18:13Z","department":[{"_id":"DEP5023"}],"citation":{"mla":"Bunte, Andreas, et al. <i>Model-Based Diagnosis for Cyber-Physical Production Systems Based on Machine Learning and Residual-Based Diagnosis Models</i>. Thirty-Third AAAI Conference on Artificial Intelligence (AAAI-19), 2019.","van":"Bunte A, Stein B, Niggemann O. Model-Based Diagnosis for Cyber-Physical Production Systems Based on Machine Learning and Residual-Based Diagnosis Models. In Hawaii, USA: Thirty-Third AAAI Conference on Artificial Intelligence (AAAI-19); 2019.","havard":"A. Bunte, B. Stein, O. Niggemann, Model-Based Diagnosis for Cyber-Physical Production Systems Based on Machine Learning and Residual-Based Diagnosis Models, in: Thirty-Third AAAI Conference on Artificial Intelligence (AAAI-19), Hawaii, USA, 2019.","short":"A. Bunte, B. Stein, O. Niggemann, in: Thirty-Third AAAI Conference on Artificial Intelligence (AAAI-19), Hawaii, USA, 2019.","ieee":"A. Bunte, B. Stein, and O. Niggemann, “Model-Based Diagnosis for Cyber-Physical Production Systems Based on Machine Learning and Residual-Based Diagnosis Models,” 2019.","bjps":"<b>Bunte A, Stein B and Niggemann O</b> (2019) Model-Based Diagnosis for Cyber-Physical Production Systems Based on Machine Learning and Residual-Based Diagnosis Models. Hawaii, USA: Thirty-Third AAAI Conference on Artificial Intelligence (AAAI-19).","ufg":"<b>Bunte, Andreas et. al. (2019)</b>: Model-Based Diagnosis for Cyber-Physical Production Systems Based on Machine Learning and Residual-Based Diagnosis Models, in: , Hawaii, USA.","ama":"Bunte A, Stein B, Niggemann O. Model-Based Diagnosis for Cyber-Physical Production Systems Based on Machine Learning and Residual-Based Diagnosis Models. In: Hawaii, USA: Thirty-Third AAAI Conference on Artificial Intelligence (AAAI-19); 2019.","apa":"Bunte, A., Stein, B., &#38; Niggemann, O. (2019). Model-Based Diagnosis for Cyber-Physical Production Systems Based on Machine Learning and Residual-Based Diagnosis Models. Hawaii, USA: Thirty-Third AAAI Conference on Artificial Intelligence (AAAI-19).","chicago":"Bunte, Andreas, Benno Stein, and Oliver Niggemann. “Model-Based Diagnosis for Cyber-Physical Production Systems Based on Machine Learning and Residual-Based Diagnosis Models.” Hawaii, USA: Thirty-Third AAAI Conference on Artificial Intelligence (AAAI-19), 2019.","chicago-de":"Bunte, Andreas, Benno Stein und Oliver Niggemann. 2019. Model-Based Diagnosis for Cyber-Physical Production Systems Based on Machine Learning and Residual-Based Diagnosis Models. In: . Hawaii, USA: Thirty-Third AAAI Conference on Artificial Intelligence (AAAI-19).","din1505-2-1":"<span style=\"font-variant:small-caps;\">Bunte, Andreas</span> ; <span style=\"font-variant:small-caps;\">Stein, Benno</span> ; <span style=\"font-variant:small-caps;\">Niggemann, Oliver</span>: Model-Based Diagnosis for Cyber-Physical Production Systems Based on Machine Learning and Residual-Based Diagnosis Models. In: . Hawaii, USA : Thirty-Third AAAI Conference on Artificial Intelligence (AAAI-19), 2019"},"user_id":"68554","title":"Model-Based Diagnosis for Cyber-Physical Production Systems Based on Machine Learning and Residual-Based Diagnosis Models"}