{"language":[{"iso":"eng"}],"conference":{"name":"67th IEEE Holm Conference on Electrical Contacts"},"citation":{"ieee":"P. Kolmer, M. Rojer, J. Song, and D. Schramm, “Surface Degradation of Electrical Connectors stressed by Accelerated Multivariable Lifetime-Test,” in <i>Proceedings of the 67th IEEE Holm Conference on Electrical Contacts</i>, 2021.","havard":"P. Kolmer, M. Rojer, J. Song, D. Schramm, Surface Degradation of Electrical Connectors stressed by Accelerated Multivariable Lifetime-Test, in: Proceedings of the 67th IEEE Holm Conference on Electrical Contacts, 2021.","ufg":"<b>Kolmer, Philipp et. al. (2021)</b>: Surface Degradation of Electrical Connectors stressed by Accelerated Multivariable Lifetime-Test, in: <i>Proceedings of the 67th IEEE Holm Conference on Electrical Contacts</i>.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Kolmer, Philipp</span> ; <span style=\"font-variant:small-caps;\">Rojer, Markus</span> ; <span style=\"font-variant:small-caps;\">Song, Jian</span> ; <span style=\"font-variant:small-caps;\">Schramm, Dieter</span>: Surface Degradation of Electrical Connectors stressed by Accelerated Multivariable Lifetime-Test. In: <i>Proceedings of the 67th IEEE Holm Conference on Electrical Contacts</i>, 2021","ama":"Kolmer P, Rojer M, Song J, Schramm D. Surface Degradation of Electrical Connectors stressed by Accelerated Multivariable Lifetime-Test. In: <i>Proceedings of the 67th IEEE Holm Conference on Electrical Contacts</i>. ; 2021.","chicago":"Kolmer, Philipp, Markus Rojer, Jian Song, and Dieter Schramm. “Surface Degradation of Electrical Connectors Stressed by Accelerated Multivariable Lifetime-Test.” In <i>Proceedings of the 67th IEEE Holm Conference on Electrical Contacts</i>, 2021.","bjps":"<b>Kolmer P <i>et al.</i></b> (2021) Surface Degradation of Electrical Connectors Stressed by Accelerated Multivariable Lifetime-Test. <i>Proceedings of the 67th IEEE Holm Conference on Electrical Contacts</i>.","mla":"Kolmer, Philipp, et al. “Surface Degradation of Electrical Connectors Stressed by Accelerated Multivariable Lifetime-Test.” <i>Proceedings of the 67th IEEE Holm Conference on Electrical Contacts</i>, 2021.","apa":"Kolmer, P., Rojer, M., Song, J., &#38; Schramm, D. (2021). Surface Degradation of Electrical Connectors stressed by Accelerated Multivariable Lifetime-Test. In <i>Proceedings of the 67th IEEE Holm Conference on Electrical Contacts</i>.","van":"Kolmer P, Rojer M, Song J, Schramm D. Surface Degradation of Electrical Connectors stressed by Accelerated Multivariable Lifetime-Test. In: Proceedings of the 67th IEEE Holm Conference on Electrical Contacts. 2021.","short":"P. Kolmer, M. Rojer, J. Song, D. Schramm, in: Proceedings of the 67th IEEE Holm Conference on Electrical Contacts, 2021.","chicago-de":"Kolmer, Philipp, Markus Rojer, Jian Song und Dieter Schramm. 2021. Surface Degradation of Electrical Connectors stressed by Accelerated Multivariable Lifetime-Test. In: <i>Proceedings of the 67th IEEE Holm Conference on Electrical Contacts</i>."},"_id":"6323","date_updated":"2023-03-15T13:50:05Z","department":[{"_id":"DEP6012"}],"date_created":"2021-09-16T08:13:06Z","status":"public","type":"conference","year":2021,"publication":"Proceedings of the 67th IEEE Holm Conference on Electrical Contacts","title":"Surface Degradation of Electrical Connectors stressed by Accelerated Multivariable Lifetime-Test","user_id":"74004","author":[{"first_name":"Philipp","full_name":"Kolmer, Philipp","last_name":"Kolmer"},{"first_name":"Markus","full_name":"Rojer, Markus","last_name":"Rojer"},{"last_name":"Song","full_name":"Song, Jian","id":"5297","first_name":"Jian"},{"first_name":"Dieter","full_name":"Schramm, Dieter","last_name":"Schramm"}]}