{"language":[{"iso":"eng"}],"conference":{"name":"65th IEEE Holm Conference on Electrical Contacts","location":"Milwaukee"},"date_created":"2021-09-16T08:13:06Z","year":2019,"date_updated":"2023-03-15T13:50:05Z","_id":"6326","author":[{"first_name":"Jian","id":"5297","last_name":"Song","full_name":"Song, Jian"},{"first_name":"Haomiao","full_name":"Yuan, Haomiao","last_name":"Yuan","id":"61860"},{"first_name":"Abhay Rammurti","id":"74188","last_name":"Shukla","full_name":"Shukla, Abhay Rammurti"},{"first_name":"Christian","last_name":"Koch","full_name":"Koch, Christian"},{"full_name":"Hilmert, Dirk","last_name":"Hilmert","id":"74212","first_name":"Dirk"}],"status":"public","type":"conference","title":"Correlation of connector contact failures in accelerated testing and in long-term use field vehicles","user_id":"74004","department":[{"_id":"DEP6012"}],"citation":{"chicago":"Song, Jian, Haomiao Yuan, Abhay Rammurti Shukla, Christian Koch, and Dirk Hilmert. “Correlation of Connector Contact Failures in Accelerated Testing and in Long-Term Use Field Vehicles.” In <i>Proceedings of the 65th IEEE Holm Conference on Electrical Contacts</i>, 2019.","din1505-2-1":"<span style=\"font-variant:small-caps;\">Song, Jian</span> ; <span style=\"font-variant:small-caps;\">Yuan, Haomiao</span> ; <span style=\"font-variant:small-caps;\">Shukla, Abhay Rammurti</span> ; <span style=\"font-variant:small-caps;\">Koch, Christian</span> ; <span style=\"font-variant:small-caps;\">Hilmert, Dirk</span>: Correlation of connector contact failures in accelerated testing and in long-term use field vehicles. In: <i>Proceedings of the 65th IEEE Holm Conference on Electrical Contacts</i>, 2019","chicago-de":"Song, Jian, Haomiao Yuan, Abhay Rammurti Shukla, Christian Koch und Dirk Hilmert. 2019. Correlation of connector contact failures in accelerated testing and in long-term use field vehicles. In: <i>Proceedings of the 65th IEEE Holm Conference on Electrical Contacts</i>.","mla":"Song, Jian, et al. “Correlation of Connector Contact Failures in Accelerated Testing and in Long-Term Use Field Vehicles.” <i>Proceedings of the 65th IEEE Holm Conference on Electrical Contacts</i>, 2019.","apa":"Song, J., Yuan, H., Shukla, A. R., Koch, C., &#38; Hilmert, D. (2019). Correlation of connector contact failures in accelerated testing and in long-term use field vehicles. In <i>Proceedings of the 65th IEEE Holm Conference on Electrical Contacts</i>. Milwaukee.","ama":"Song J, Yuan H, Shukla AR, Koch C, Hilmert D. Correlation of connector contact failures in accelerated testing and in long-term use field vehicles. In: <i>Proceedings of the 65th IEEE Holm Conference on Electrical Contacts</i>. ; 2019.","havard":"J. Song, H. Yuan, A.R. Shukla, C. Koch, D. Hilmert, Correlation of connector contact failures in accelerated testing and in long-term use field vehicles, in: Proceedings of the 65th IEEE Holm Conference on Electrical Contacts, 2019.","van":"Song J, Yuan H, Shukla AR, Koch C, Hilmert D. Correlation of connector contact failures in accelerated testing and in long-term use field vehicles. In: Proceedings of the 65th IEEE Holm Conference on Electrical Contacts. 2019.","ufg":"<b>Song, Jian et. al. (2019)</b>: Correlation of connector contact failures in accelerated testing and in long-term use field vehicles, in: <i>Proceedings of the 65th IEEE Holm Conference on Electrical Contacts</i>.","bjps":"<b>Song J <i>et al.</i></b> (2019) Correlation of Connector Contact Failures in Accelerated Testing and in Long-Term Use Field Vehicles. <i>Proceedings of the 65th IEEE Holm Conference on Electrical Contacts</i>.","ieee":"J. Song, H. Yuan, A. R. Shukla, C. Koch, and D. Hilmert, “Correlation of connector contact failures in accelerated testing and in long-term use field vehicles,” in <i>Proceedings of the 65th IEEE Holm Conference on Electrical Contacts</i>, Milwaukee, 2019.","short":"J. Song, H. Yuan, A.R. Shukla, C. Koch, D. Hilmert, in: Proceedings of the 65th IEEE Holm Conference on Electrical Contacts, 2019."},"publication":"Proceedings of the 65th IEEE Holm Conference on Electrical Contacts"}