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<titleInfo><title>State of Health of Connectors – Early Indicators</title></titleInfo>


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<name type="personal">
  <namePart type="given">Jian</namePart>
  <namePart type="family">Song</namePart>
  <role><roleTerm type="text">author</roleTerm> </role><identifier type="local">5297</identifier></name>
<name type="personal">
  <namePart type="given">Abhay Rammurti</namePart>
  <namePart type="family">Shukla</namePart>
  <role><roleTerm type="text">author</roleTerm> </role><identifier type="local">72757</identifier></name>
<name type="personal">
  <namePart type="given">Roman</namePart>
  <namePart type="family">Probst</namePart>
  <role><roleTerm type="text">author</roleTerm> </role><identifier type="local">69156</identifier></name>







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  <identifier type="local">DEP6012</identifier>
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  <namePart>67th Holm Conference on Electrical Contacts</namePart>
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<abstract lang="eng">Lifetime tests of connectors are time consuming and labor intensive. Our study reveals a strong correlation between the statistical characteristics of contact resistance development in the early stages of lifetime tests and the final results of the tests. This correlation enables a further time lapse of lifetime tests and the prediction of the state of the health of connectors which can be utilized in the development of diagnostic strategy in sophisticated networks with very high number of connectors as well as in a quick classification of connectors with respect to their design features. Methods of statistical evaluation are introduced and the sensitivity analyses of different characteristics for the state of health of connectors are conducted.</abstract>

<originInfo><publisher>IEEE</publisher><dateIssued encoding="w3cdtf">2022</dateIssued><place><placeTerm type="text">Tampa, FL, USA</placeTerm></place>
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<language><languageTerm authority="iso639-2b" type="code">eng</languageTerm>
</language>

<subject><topic>Connectors</topic><topic>Correlation</topic><topic>Sensitivity analysis</topic><topic>Contact resistance</topic><topic>Lifetime estimation</topic><topic>Reliability</topic><topic>Electrical resistance measurement</topic>
</subject>


<relatedItem type="host"><titleInfo><title>Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts</title></titleInfo>
  <identifier type="issn">2158-9992</identifier>
  <identifier type="isbn">978-1-6654-5966-2</identifier>
  <identifier type="isbn">978-1-6654-5967-9</identifier><identifier type="doi">10.1109/HLM54538.2022.9969839</identifier>
<part><extent unit="pages">272 - 278</extent>
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<chicago-de>Song, Jian, Abhay Rammurti Shukla und Roman Probst. 2022. &lt;i&gt;State of Health of Connectors – Early Indicators&lt;/i&gt;. &lt;i&gt;Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts&lt;/i&gt;. Piscataway, NJ: IEEE. doi:&lt;a href=&quot;https://doi.org/10.1109/HLM54538.2022.9969839&quot;&gt;10.1109/HLM54538.2022.9969839&lt;/a&gt;, .</chicago-de>
<bjps>&lt;b&gt;Song J, Shukla AR and Probst R&lt;/b&gt; (2022) &lt;i&gt;State of Health of Connectors – Early Indicators&lt;/i&gt;. Piscataway, NJ: IEEE.</bjps>
<din1505-2-1>&lt;span style=&quot;font-variant:small-caps;&quot;&gt;Song, Jian&lt;/span&gt; ; &lt;span style=&quot;font-variant:small-caps;&quot;&gt;Shukla, Abhay Rammurti&lt;/span&gt; ; &lt;span style=&quot;font-variant:small-caps;&quot;&gt;Probst, Roman&lt;/span&gt;: &lt;i&gt;State of Health of Connectors – Early Indicators&lt;/i&gt;. Piscataway, NJ : IEEE, 2022</din1505-2-1>
<chicago>Song, Jian, Abhay Rammurti Shukla, and Roman Probst. &lt;i&gt;State of Health of Connectors – Early Indicators&lt;/i&gt;. &lt;i&gt;Electrical Contacts - 2022 : Proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts&lt;/i&gt;. Piscataway, NJ: IEEE, 2022. &lt;a href=&quot;https://doi.org/10.1109/HLM54538.2022.9969839&quot;&gt;https://doi.org/10.1109/HLM54538.2022.9969839&lt;/a&gt;.</chicago>
<short>J. Song, A.R. Shukla, R. Probst, State of Health of Connectors – Early Indicators, IEEE, Piscataway, NJ, 2022.</short>
<mla>Song, Jian, et al. “State of Health of Connectors – Early Indicators.” &lt;i&gt;Electrical Contacts - 2022 : Proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts&lt;/i&gt;, IEEE, 2022, pp. 272–78, &lt;a href=&quot;https://doi.org/10.1109/HLM54538.2022.9969839&quot;&gt;https://doi.org/10.1109/HLM54538.2022.9969839&lt;/a&gt;.</mla>
<van>Song J, Shukla AR, Probst R. State of Health of Connectors – Early Indicators. Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts. Piscataway, NJ: IEEE; 2022.</van>
<ieee>J. Song, A. R. Shukla, and R. Probst, &lt;i&gt;State of Health of Connectors – Early Indicators&lt;/i&gt;. Piscataway, NJ: IEEE, 2022, pp. 272–278. doi: &lt;a href=&quot;https://doi.org/10.1109/HLM54538.2022.9969839&quot;&gt;10.1109/HLM54538.2022.9969839&lt;/a&gt;.</ieee>
<ufg>&lt;b&gt;Song, Jian/Shukla, Abhay Rammurti/Probst, Roman&lt;/b&gt;: State of Health of Connectors – Early Indicators, Piscataway, NJ 2022.</ufg>
<havard>J. Song, A.R. Shukla, R. Probst, State of Health of Connectors – Early Indicators, IEEE, Piscataway, NJ, 2022.</havard>
<apa>Song, J., Shukla, A. R., &amp;#38; Probst, R. (2022). State of Health of Connectors – Early Indicators. In &lt;i&gt;Electrical contacts - 2022 : proceedings of the Sixty-Seventh IEEE Holm Conference on Electrical Contacts&lt;/i&gt; (pp. 272–278). IEEE. &lt;a href=&quot;https://doi.org/10.1109/HLM54538.2022.9969839&quot;&gt;https://doi.org/10.1109/HLM54538.2022.9969839&lt;/a&gt;</apa>
<ama>Song J, Shukla AR, Probst R. &lt;i&gt;State of Health of Connectors – Early Indicators&lt;/i&gt;. IEEE; 2022:272-278. doi:&lt;a href=&quot;https://doi.org/10.1109/HLM54538.2022.9969839&quot;&gt;10.1109/HLM54538.2022.9969839&lt;/a&gt;</ama>
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