Application-based Approach for Automatic Texture Defect Recognition on Synthetic Surfaces

M. Niederhöfer, V. Lohweg, in: 13th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2008), Hamburg, Germany, 2008.

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Konferenz - Beitrag | Veröffentlicht | Englisch
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Abstract
Synthetic surfaces, in particular polymer structures, which are used for electronic components, have to be inspected in industrial processes. Polymers show some specific surface characteristics. This a-priori knowledge is useable for the feature extraction of a surface texture and a following classification. The feature extraction is performed by using statistical information, calculated from sum and difference histograms, while the classification is executed by a fuzzy pattern classifier. A defect area can be recognized just on the basis of the tested image and without the need of any further reference learning data. The classification of a defect part is achieved by analyzing the divergence of the extracted feature values from their median related to the inspected area. Surfaces that contain an inconsistent texture will be rejected.
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13th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2008)
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Niederhöfer M, Lohweg V. Application-based Approach for Automatic Texture Defect Recognition on Synthetic Surfaces. In: 13th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2008). Hamburg, Germany; 2008. doi:10.1109/ETFA.2008.4638397
Niederhöfer, M., & Lohweg, V. (2008). Application-based Approach for Automatic Texture Defect Recognition on Synthetic Surfaces. In 13th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2008). Hamburg, Germany. https://doi.org/10.1109/ETFA.2008.4638397
Niederhöfer M and Lohweg V (2008) Application-Based Approach for Automatic Texture Defect Recognition on Synthetic Surfaces. 13th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2008). Hamburg, Germany.
Niederhöfer, Marcus, and Volker Lohweg. “Application-Based Approach for Automatic Texture Defect Recognition on Synthetic Surfaces.” In 13th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2008). Hamburg, Germany, 2008. https://doi.org/10.1109/ETFA.2008.4638397.
Niederhöfer, Marcus und Volker Lohweg. 2008. Application-based Approach for Automatic Texture Defect Recognition on Synthetic Surfaces. In: 13th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2008). Hamburg, Germany. doi:10.1109/ETFA.2008.4638397, .
Niederhöfer, Marcus ; Lohweg, Volker: Application-based Approach for Automatic Texture Defect Recognition on Synthetic Surfaces. In: 13th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2008). Hamburg, Germany, 2008
M. Niederhöfer, V. Lohweg, Application-based Approach for Automatic Texture Defect Recognition on Synthetic Surfaces, in: 13th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2008), Hamburg, Germany, 2008.
M. Niederhöfer and V. Lohweg, “Application-based Approach for Automatic Texture Defect Recognition on Synthetic Surfaces,” in 13th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2008), 2008.
Niederhöfer, Marcus, and Volker Lohweg. “Application-Based Approach for Automatic Texture Defect Recognition on Synthetic Surfaces.” 13th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2008), 2008, doi:10.1109/ETFA.2008.4638397.
Niederhöfer, Marcus/Lohweg, Volker (2008): Application-based Approach for Automatic Texture Defect Recognition on Synthetic Surfaces, in: 13th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2008), Hamburg, Germany.
Niederhöfer M, Lohweg V. Application-based Approach for Automatic Texture Defect Recognition on Synthetic Surfaces. In: 13th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2008). Hamburg, Germany; 2008.

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