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1 Publikation
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 9207
Krüger, Kevin ; Song, Jian: The influence of thermal cycling test parameters on the failure rate of electrical connectors. In: Microelectronics reliability : an internat. journal & world abstracting service Bd. 138. Amsterdam, Elsevier (2022), Nr. November 2022
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