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1 Publikation
2023 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 11348
Shukla, Abhay Rammurti, et al. “Comparison of Different Statistical Methods for Prediction of Lifetime of Electrical Connectors with Short Term Tests.” Microelectronics Reliability, vol. 150, 115216, 2023, https://doi.org/10.1016/j.microrel.2023.115216.
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