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3 Publikationen
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 9206
Song, Jian ; Shukla, Abhay Rammurti ; Probst, Roman: Prediction of failure in time (FIT) of electrical connectors with short term tests. In: Microelectronics reliability : an internat. journal & world abstracting service Bd. 138. Amsterdam, Elsevier (2022), Nr. November 2022
ELSA
| DOI
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 9207
Krüger, Kevin ; Song, Jian: The influence of thermal cycling test parameters on the failure rate of electrical connectors. In: Microelectronics reliability : an internat. journal & world abstracting service Bd. 138. Amsterdam, Elsevier (2022), Nr. November 2022
ELSA
| DOI