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1 Publikation
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 9207
Krüger, Kevin und Jian Song. 2022. The influence of thermal cycling test parameters on the failure rate of electrical connectors. Microelectronics reliability : an internat. journal & world abstracting service 138, Nr. November 2022. doi:https://doi.org/10.1016/j.microrel.2022.114633, .
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