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1 Publikation
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 9206
Song, Jian, Abhay Rammurti Shukla, and Roman Probst. “Prediction of Failure in Time (FIT) of Electrical Connectors with Short Term Tests.” Microelectronics Reliability : An Internat. Journal & World Abstracting Service 138, no. November 2022 (2022). https://doi.org/10.1016/j.microrel.2022.114684.
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