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1 Publikation


2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 8353
The influence of the vibration test mode on the failure rate of electrical connectors
K. Krüger, H. Yuan, J. Song, Microelectronics Reliability : An Internat. Journal & World Abstracting Service 135 (2022).
ELSA | DOI
 

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