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1 Publikation
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 8353
Krüger, Kevin, Haomiao Yuan, and Jian Song. “The Influence of the Vibration Test Mode on the Failure Rate of Electrical Connectors.” Microelectronics Reliability : An Internat. Journal & World Abstracting Service 135, no. 8 (2022). https://doi.org/10.1016/j.microrel.2022.114567.
ELSA
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