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1 Publikation
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 8353
Krüger, K., Yuan, H., & Song, J. (2022). The influence of the vibration test mode on the failure rate of electrical connectors. Microelectronics Reliability : An Internat. Journal & World Abstracting Service, 135(8), Article 114567. https://doi.org/10.1016/j.microrel.2022.114567
ELSA
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