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1 Publikation
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 9207
Krüger, Kevin, and Jian Song. “The Influence of Thermal Cycling Test Parameters on the Failure Rate of Electrical Connectors.” Microelectronics Reliability : An Internat. Journal & World Abstracting Service, vol. 138, no. November 2022, 114633, 2022, https://doi.org/10.1016/j.microrel.2022.114633.
ELSA
| DOI