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1 Publikation


2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 9207
Krüger, Kevin/Song, Jian: The influence of thermal cycling test parameters on the failure rate of electrical connectors, in: Microelectronics reliability : an internat. journal & world abstracting service 138 (2022), H. November 2022.
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Zitationsstil: Universität Freiburg

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