4 Publikationen

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[4]
2022 | Konferenzband - Beitrag | ELSA-ID: 7528
D. Hilmert, K. Krüger, H. Yuan, J. Song, Wear of electrical contacts of equal motion amplitude and equal force in different directions, TAE, Technische Akademie Esslingen, Ostfildern , 2022.
ELSA | Download (ext.)
 
[3]
2022 | Konferenzband - Beitrag | ELSA-ID: 7529
K. Krüger, D. Hilmert, J. Song, Mounting Positions of Electrical Connectors and the Wear of Coatings under Vibration Loads, TAE, Technische Akademie Esslingen, Ostfildern, 2022.
ELSA | Download (ext.)
 
[2]
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 8353
K. Krüger, H. Yuan, J. Song, The influence of the vibration test mode on the failure rate of electrical connectors, Microelectronics Reliability : An Internat. Journal & World Abstracting Service. 135 (2022).
ELSA | DOI
 
[1]
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 9207
K. Krüger, J. Song, The influence of thermal cycling test parameters on the failure rate of electrical connectors, Microelectronics Reliability : An Internat. Journal & World Abstracting Service. 138 (2022).
ELSA | DOI
 

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4 Publikationen

Alle markieren

[4]
2022 | Konferenzband - Beitrag | ELSA-ID: 7528
D. Hilmert, K. Krüger, H. Yuan, J. Song, Wear of electrical contacts of equal motion amplitude and equal force in different directions, TAE, Technische Akademie Esslingen, Ostfildern , 2022.
ELSA | Download (ext.)
 
[3]
2022 | Konferenzband - Beitrag | ELSA-ID: 7529
K. Krüger, D. Hilmert, J. Song, Mounting Positions of Electrical Connectors and the Wear of Coatings under Vibration Loads, TAE, Technische Akademie Esslingen, Ostfildern, 2022.
ELSA | Download (ext.)
 
[2]
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 8353
K. Krüger, H. Yuan, J. Song, The influence of the vibration test mode on the failure rate of electrical connectors, Microelectronics Reliability : An Internat. Journal & World Abstracting Service. 135 (2022).
ELSA | DOI
 
[1]
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 9207
K. Krüger, J. Song, The influence of thermal cycling test parameters on the failure rate of electrical connectors, Microelectronics Reliability : An Internat. Journal & World Abstracting Service. 138 (2022).
ELSA | DOI
 

Suche

Publikationen filtern

Darstellung / Sortierung

Zitationsstil: Elsevier Havard

Export / Einbettung