4 Publikationen
2022 | Konferenzband - Beitrag | ELSA-ID: 7528
Hilmert D, Krüger K, Yuan H, Song J. Wear of Electrical Contacts of Equal Motion Amplitude and Equal Force in Different Directions. Vol 23/1. (Topolovec-Miklozic K, ed.). TAE, Technische Akademie Esslingen; 2022:313-315.
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2022 | Konferenzband - Beitrag | ELSA-ID: 7529
Krüger K, Hilmert D, Song J. Mounting Positions of Electrical Connectors and the Wear of Coatings under Vibration Loads. Vol 23/1. (Topolovec-Miklozic K, Pauschitz A, Fatemi A, Technische Akademie Esslingen, eds.). TAE, Technische Akademie Esslingen; 2022:219-222.
ELSA
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2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 8353
Krüger K, Yuan H, Song J. The influence of the vibration test mode on the failure rate of electrical connectors. Microelectronics reliability : an internat journal & world abstracting service. 2022;135(8). doi:https://doi.org/10.1016/j.microrel.2022.114567
ELSA
| DOI
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 9207
Krüger K, Song J. The influence of thermal cycling test parameters on the failure rate of electrical connectors. Microelectronics reliability : an internat journal & world abstracting service. 2022;138(November 2022). doi:https://doi.org/10.1016/j.microrel.2022.114633
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4 Publikationen
2022 | Konferenzband - Beitrag | ELSA-ID: 7528
Hilmert D, Krüger K, Yuan H, Song J. Wear of Electrical Contacts of Equal Motion Amplitude and Equal Force in Different Directions. Vol 23/1. (Topolovec-Miklozic K, ed.). TAE, Technische Akademie Esslingen; 2022:313-315.
ELSA
| Download (ext.)
2022 | Konferenzband - Beitrag | ELSA-ID: 7529
Krüger K, Hilmert D, Song J. Mounting Positions of Electrical Connectors and the Wear of Coatings under Vibration Loads. Vol 23/1. (Topolovec-Miklozic K, Pauschitz A, Fatemi A, Technische Akademie Esslingen, eds.). TAE, Technische Akademie Esslingen; 2022:219-222.
ELSA
| Download (ext.)
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 8353
Krüger K, Yuan H, Song J. The influence of the vibration test mode on the failure rate of electrical connectors. Microelectronics reliability : an internat journal & world abstracting service. 2022;135(8). doi:https://doi.org/10.1016/j.microrel.2022.114567
ELSA
| DOI
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 9207
Krüger K, Song J. The influence of thermal cycling test parameters on the failure rate of electrical connectors. Microelectronics reliability : an internat journal & world abstracting service. 2022;138(November 2022). doi:https://doi.org/10.1016/j.microrel.2022.114633
ELSA
| DOI