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[4]
2022 | Konferenzband - Beitrag | ELSA-ID: 7528
D. Hilmert, K. Krüger, H. Yuan, and J. Song, Wear of electrical contacts of equal motion amplitude and equal force in different directions, vol. 23/1. Ostfildern : TAE, Technische Akademie Esslingen, 2022, pp. 313–315.
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[3]
2022 | Konferenzband - Beitrag | ELSA-ID: 7529
K. Krüger, D. Hilmert, and J. Song, Mounting Positions of Electrical Connectors and the Wear of Coatings under Vibration Loads, vol. 23/1. Ostfildern: TAE, Technische Akademie Esslingen, 2022, pp. 219–222.
ELSA | Download (ext.)
 
[2]
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 8353
K. Krüger, H. Yuan, and J. Song, “The influence of the vibration test mode on the failure rate of electrical connectors,” Microelectronics reliability : an internat. journal & world abstracting service, vol. 135, no. 8, Art. no. 114567, 2022, doi: https://doi.org/10.1016/j.microrel.2022.114567.
ELSA | DOI
 
[1]
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 9207
K. Krüger and J. Song, “The influence of thermal cycling test parameters on the failure rate of electrical connectors,” Microelectronics reliability : an internat. journal & world abstracting service, vol. 138, no. November 2022, Art. no. 114633, 2022, doi: https://doi.org/10.1016/j.microrel.2022.114633.
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4 Publikationen

Alle markieren

[4]
2022 | Konferenzband - Beitrag | ELSA-ID: 7528
D. Hilmert, K. Krüger, H. Yuan, and J. Song, Wear of electrical contacts of equal motion amplitude and equal force in different directions, vol. 23/1. Ostfildern : TAE, Technische Akademie Esslingen, 2022, pp. 313–315.
ELSA | Download (ext.)
 
[3]
2022 | Konferenzband - Beitrag | ELSA-ID: 7529
K. Krüger, D. Hilmert, and J. Song, Mounting Positions of Electrical Connectors and the Wear of Coatings under Vibration Loads, vol. 23/1. Ostfildern: TAE, Technische Akademie Esslingen, 2022, pp. 219–222.
ELSA | Download (ext.)
 
[2]
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 8353
K. Krüger, H. Yuan, and J. Song, “The influence of the vibration test mode on the failure rate of electrical connectors,” Microelectronics reliability : an internat. journal & world abstracting service, vol. 135, no. 8, Art. no. 114567, 2022, doi: https://doi.org/10.1016/j.microrel.2022.114567.
ELSA | DOI
 
[1]
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 9207
K. Krüger and J. Song, “The influence of thermal cycling test parameters on the failure rate of electrical connectors,” Microelectronics reliability : an internat. journal & world abstracting service, vol. 138, no. November 2022, Art. no. 114633, 2022, doi: https://doi.org/10.1016/j.microrel.2022.114633.
ELSA | DOI
 

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Zitationsstil: IEEE

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