4 Publikationen

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[4]
2022 | Konferenzband - Beitrag | ELSA-ID: 7528
Hilmert, D., Krüger, K., Yuan, H., & Song, J. (2022). Wear of electrical contacts of equal motion amplitude and equal force in different directions. Proceedings of the 23rd International Colloquium Tribology (pp. 313 – 315). TAE.
ELSA
 
[3]
2022 | Konferenzband - Beitrag | ELSA-ID: 7529
Krüger, K., Hilmert, D., & Song, J. (2022). Mounting Positions of Electrical Connectors and the Wear of Coatings under Vibration Loads. Proceedings of the 23rd International Colloquium Tribology (pp. 219 – 222). TAE.
ELSA
 
[2]
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 8353 | OA
Krüger, K., Yuan, H., & Song, J. (2022). The influence of the vibration test mode on the failure rate of electrical connectors. Microelectronics Reliability. https://doi.org/10.1016/j.microrel.2022.114567
ELSA | Dateien verfügbar | DOI
 
[1]
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 9207
Krüger, Kevin, The influence of thermal cycling test parameters on the failure rate of electrical connectors. Microelectronics Reliability 138 (November 2022). , 2022
ELSA | DOI
 

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4 Publikationen

Alle markieren

[4]
2022 | Konferenzband - Beitrag | ELSA-ID: 7528
Hilmert, D., Krüger, K., Yuan, H., & Song, J. (2022). Wear of electrical contacts of equal motion amplitude and equal force in different directions. Proceedings of the 23rd International Colloquium Tribology (pp. 313 – 315). TAE.
ELSA
 
[3]
2022 | Konferenzband - Beitrag | ELSA-ID: 7529
Krüger, K., Hilmert, D., & Song, J. (2022). Mounting Positions of Electrical Connectors and the Wear of Coatings under Vibration Loads. Proceedings of the 23rd International Colloquium Tribology (pp. 219 – 222). TAE.
ELSA
 
[2]
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 8353 | OA
Krüger, K., Yuan, H., & Song, J. (2022). The influence of the vibration test mode on the failure rate of electrical connectors. Microelectronics Reliability. https://doi.org/10.1016/j.microrel.2022.114567
ELSA | Dateien verfügbar | DOI
 
[1]
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 9207
Krüger, Kevin, The influence of thermal cycling test parameters on the failure rate of electrical connectors. Microelectronics Reliability 138 (November 2022). , 2022
ELSA | DOI
 

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