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1 Publikation
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 9206
Song, Jian, Abhay Rammurti Shukla und Roman Probst. 2022. Prediction of failure in time (FIT) of electrical connectors with short term tests. Microelectronics reliability : an internat. journal & world abstracting service 138, Nr. November 2022. doi:10.1016/j.microrel.2022.114684, .
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