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1 Publikation
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 9206
Song, J., Shukla, A. R., & Probst, R. (2022). Prediction of failure in time (FIT) of electrical connectors with short term tests. Microelectronics Reliability : An Internat. Journal & World Abstracting Service, 138(November 2022), Article 114684. https://doi.org/10.1016/j.microrel.2022.114684
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