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1 Publikation


2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 9206
Song, Jian/Shukla, Abhay Rammurti/Probst, Roman: Prediction of failure in time (FIT) of electrical connectors with short term tests, in: Microelectronics reliability : an internat. journal & world abstracting service 138 (2022), H. November 2022.
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keyword="Correlation between data in short and long term tests"

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Zitationsstil: Universität Freiburg

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