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1 Publikation


2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 8353
Krüger K, Yuan H, Song J. The influence of the vibration test mode on the failure rate of electrical connectors. Microelectronics reliability : an internat journal & world abstracting service. 2022;135(8). doi:https://doi.org/10.1016/j.microrel.2022.114567
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