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1 Publikation
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 8353
K. Krüger, H. Yuan, and J. Song, “The influence of the vibration test mode on the failure rate of electrical connectors,” Microelectronics reliability : an internat. journal & world abstracting service, vol. 135, no. 8, Art. no. 114567, 2022, doi: https://doi.org/10.1016/j.microrel.2022.114567.
ELSA
| DOI