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1 Publikation


2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 8353
Krüger, Kevin ; Yuan, Haomiao ; Song, Jian: The influence of the vibration test mode on the failure rate of electrical connectors. In: Microelectronics reliability : an internat. journal & world abstracting service Bd. 135. Amsterdam, Elsevier (2022), Nr. 8
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Zitationsstil: Din 1505-2

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