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1 Publikation
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 9207
Krüger K, Song J. The influence of thermal cycling test parameters on the failure rate of electrical connectors. Microelectronics reliability : an internat journal & world abstracting service. 2022;138(November 2022). doi:https://doi.org/10.1016/j.microrel.2022.114633
ELSA
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