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1 Publikation


2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 9207
K. Krüger and J. Song, “The influence of thermal cycling test parameters on the failure rate of electrical connectors,” Microelectronics reliability : an internat. journal & world abstracting service, vol. 138, no. November 2022, Art. no. 114633, 2022, doi: https://doi.org/10.1016/j.microrel.2022.114633.
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Zitationsstil: IEEE

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