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1 Publikation
2022 | Zeitschriftenaufsatz (wiss.) | ELSA-ID: 9207
Krüger, K., & Song, J. (2022). The influence of thermal cycling test parameters on the failure rate of electrical connectors. Microelectronics Reliability : An Internat. Journal & World Abstracting Service, 138(November 2022), Article 114633. https://doi.org/10.1016/j.microrel.2022.114633
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